SCHEMBL2625634

SCHEMBL2625634

C=C(C)C(=O)OCOC(=O)CCC

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TSHR P16473 5/20 0.50
THRB P10828 1/20 0.47
ALDH1A1 P00352 4/20 0.44
DGKA P23743 1/20 0.36
MGAM O43451 1/20 0.34
GAA P10253 1/20 0.34
SI P14410 1/20 0.34
MGAM2 Q2M2H8 1/20 0.34
PAM P19021 2/20 0.33
CES2 O00748 1/20 0.33
CES1 P23141 1/20 0.33
CYP1A2 P05177 1/20 0.32
FFAR3 O14843 1/20 0.32
HDAC3 O15379 1/20 0.32
HDAC1 Q13547 1/20 0.32
HDAC2 Q92769 1/20 0.32
HDAC8 Q9BY41 1/20 0.32
POLB P06746 1/20 0.32
APEX1 P27695 1/20 0.32
HTT P42858 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL93563 0.89 TSHR (0.50) TSHRTHRBALDH1A1DGKAMGAM
SCHEMBL11986041 0.88 TSHR (0.56) TSHRTHRBALDH1A1DGKAPAM
SCHEMBL11685242 0.86 THRB (0.60) TSHRTHRBALDH1A1DGKAPOLB
SCHEMBL7755386 0.85 TSHR (0.47) TSHRTHRBALDH1A1DGKAPAM
SCHEMBL148579 0.84 TSHR (0.58) TSHRTHRBALDH1A1MGAMGAA
SCHEMBL2609254 0.83 THRB (0.50) TSHRTHRBALDH1A1MGAMGAA
SCHEMBL12164273 0.82 TSHR (0.70) TSHRTHRBALDH1A1DGKAPOLB
SCHEMBL15449235 0.82 TSHR (0.65) TSHRTHRBALDH1A1DGKAPOLB
SCHEMBL7759129 0.82 ALDH1A1 (0.52) TSHRTHRBALDH1A1MGAMGAA
Hydrochloric Acid SCHEMBL14976774 0.82 TSHR (0.56) TSHRTHRBALDH1A1MGAMGAA

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 30 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9996002-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-06-12 US disclosed
US-9983478-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-05-29 US disclosed
US-9869929-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-01-16 US disclosed
US-9671691-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-06-06 US disclosed
US-9671693-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-06-06 US disclosed
US-9563124-B2 Photoresist composition and method for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2017-02-07 US disclosed
US-9519218-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-12-13 US disclosed
US-9405191-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-08-02 US disclosed
US-9291893-B2 Resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-22 US disclosed
US-20160077429-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2016-03-17 US disclosed
US-8511841-B2 Vehicular blind spot indicator mirror DONNELLY CORPORATION (US) 2013-08-20 US disclosed
US-20130052588-A1 SALT, PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-02-28 US disclosed
US-20130040239-A1 SALT, PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2013-02-14 US disclosed
US-20120328986-A1 SALT, PHOTORESIST COMPOSITION, AND METHOD FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-12-27 US disclosed
US-8294975-B2 Automotive rearview mirror assembly DONNELLY CORPORATION (US) 2012-10-23 US disclosed
US-20120206790-A1 ELECTROCHROMIC MIRROR REFLECTIVE ELEMENT FOR VEHICULAR REARVIEW MIRROR ASSEMBLY DONNELLY CORPORATION (US) 2012-08-16 US disclosed
US-20120156620-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-06-21 US disclosed
US-20120100483-A1 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2012-04-26 US disclosed
US-20110128137-A1 VEHICULAR BLIND SPOT INDICATOR MIRROR DONNELLY CORPORATION (US) 2011-06-02 US disclosed
US-7871169-B2 Vehicular signal mirror DONNELLY CORPORATION (US) 2011-01-18 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20120328986-A1 SALT, PHOTORESIST COMPOSITION, AND METHOD FOR PRODUCING PHOTORESIST PATTERN CLIC1, ELOVL6, RER1 TSHR 2029/4885THRB 4006/4885ALDH1A1 1554/4885
US-20130040239-A1 SALT, PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN CRY1, H1-0, SPIN1 TSHR 2801/4885THRB 4123/4885ALDH1A1 1898/4885
US-20130052588-A1 SALT, PHOTORESIST COMPOSITION AND METHOD FOR PRODUCING PHOTORESIST PATTERN RER1, COL1A1, H1-0 TSHR 2428/4885THRB 3836/4885ALDH1A1 1936/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.