SCHEMBL283100

SCHEMBL283100

C=Cc1ccc2cc(OCOC)ccc2c1

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TRPA1 O75762 1/20 0.39
HTR2C P28335 1/20 0.39
CHRNB4 P30926 2/20 0.38
CHRNA3 P32297 2/20 0.38
CHRNA7 P36544 2/20 0.38
CHRNB2 P17787 1/20 0.38
CHRNA4 P43681 1/20 0.38
EGFR P00533 1/20 0.37
PDGFRB P09619 1/20 0.37
PDGFRA P16234 1/20 0.37
NQO2 P16083 3/20 0.37
ESR1 P03372 4/20 0.36
AHR P35869 3/20 0.36
CA12 O43570 2/20 0.35
CA1 P00915 2/20 0.35
CA9 Q16790 2/20 0.35
KDR P35968 1/20 0.34
MAPT P10636 1/20 0.34
ABL1 P00519 1/20 0.34
TTR P02766 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL409780 0.83 CHRNB4 (0.51) TRPA1CHRNB4CHRNA3CHRNA7CHRNB2
SCHEMBL283041 0.83 CHRNA7 (0.43) CHRNB4CHRNA3CHRNA7CHRNB2CHRNA4
SCHEMBL657580 0.83 ALDH1A1 (0.46) MAPT
SCHEMBL3625535 0.82 RELA (0.50) CHRNB4CHRNA3CHRNA7CHRNB2CHRNA4
SCHEMBL12567390 0.82 CHRNA7 (0.47) TRPA1CHRNB4CHRNA3CHRNA7CHRNB2
SCHEMBL409207 0.81 TDP1 (0.46) CHRNA7MAPT
SCHEMBL29566387 0.80 CYP1A2 (0.54) TRPA1HTR2CNQO2ESR1AHR
SCHEMBL29566047 0.80 CYP1A2 (0.54) TRPA1HTR2CNQO2ESR1AHR
SCHEMBL190030 0.80 CYP1A2 (0.54) TRPA1HTR2CNQO2ESR1AHR
SCHEMBL3629029 0.79 RELA (0.47) CHRNB4CHRNA3CHRNA7CHRNB2CHRNA4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 33 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10719014-B2 Photoresists comprising amide component ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2020-07-21 US disclosed
US-9541834-B2 Ionic thermal acid generators for low temperature applications ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2017-01-10 US disclosed
CN-102617790-B Polymer, the method for photo-corrosion-resisting agent composition and formation photoengraving pattern ROHM AND HAAS ELECTRONIC MATERIALS CO., LTD. (US) 2016-05-25 CN disclosed
US-9298093-B2 Polymers, photoresist compositions and methods of forming photolithographic patterns ROHM AND HAAS ELECTRONIC MATERIALS LLC 2016-03-29 US disclosed
CN-102445848-B The method of photoetching compositions and formation photoengraving pattern ROHM AND HAAS ELECTRONIC MATERIALS CO., LTD. (US) 2015-08-05 CN disclosed
US-20150212414-A1 IONIC THERMAL ACID GENERATORS FOR LOW TEMPERATURE APPLICATIONS ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2015-07-30 US disclosed
US-8975001-B2 Photoresist compositions and methods of forming photolithographic patterns ROHM AND HAAS ELECTRONICS MATERIALS LLC (US) 2015-03-10 US disclosed
US-8790867-B2 Methods of forming photolithographic patterns by negative tone development ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2014-07-29 US disclosed
US-8771917-B2 Monomers, polymers, photoresist compositions and methods of forming photolithographic patterns ROHM AND HAAS ELECTRONICS MATERIALS LLC (US) 2014-07-08 US disclosed
US-20140120470-A1 PHOTORESISTS COMPRISING IONIC COMPOUND ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2014-05-01 US disclosed
US-20120171617-A1 POLYMERS, PHOTORESIST COMPOSITIONS AND METHODS OF FORMING PHOTOLITHOGRAPHIC PATTERNS DOW GLOBAL TECHNOLOGIES LLC (US) 2012-07-05 US disclosed
EP-2472325-A1 Polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-07-04 EP disclosed
EP-2472326-A1 Polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-07-04 EP disclosed
EP-2472324-A1 Monomers, polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-07-04 EP disclosed
EP-2461213-A1 Polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-06-06 EP disclosed
CN-102445848-A Photoresist compositions and methods of forming photolithographic patterns ROHM & HAAS ELECT MAT 2012-05-09 CN disclosed
US-20120077120-A1 PHOTORESISTS COMPRISING MULTI-AMIDE COMPONENT ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2012-03-29 US disclosed
US-20120064456-A1 PHOTORESIST COMPOSITIONS AND METHODS OF FORMING PHOTOLITHOGRAPHIC PATTERNS DOW GLOBAL TECHNOLOGIES LLC (US) 2012-03-15 US disclosed
EP-2428843-A1 Photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-03-14 EP disclosed
EP-2428842-A1 Photoresists comprising multi-amide component Rohm and Haas Electronic Materials LLC (US) 2012-03-14 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-10719014-B2 Photoresists comprising amide component ASPH, ALAD, SUN2 TRPA1 1122/4885HTR2C 1661/4885CHRNB4 4598/4885
US-20150212414-A1 IONIC THERMAL ACID GENERATORS FOR LOW TEMPERATURE APPLICATIONS TRIM4, TRMT1, TRIM59 TRPA1 726/4885HTR2C 3813/4885CHRNB4 1725/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.