SCHEMBL283041

SCHEMBL283041

C=Cc1ccc2cc(OCOCC)ccc2c1

nearest known ligand 0.43

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
CHRNA7 P36544 3/20 0.43
CHRNB4 P30926 2/20 0.43
CHRNA3 P32297 2/20 0.43
CHRNB2 P17787 1/20 0.43
CHRNA4 P43681 1/20 0.43
RELA Q04206 1/20 0.41
PTPN1 P18031 1/20 0.41
ESR1 P03372 2/20 0.41
AHR P35869 2/20 0.41
NCF1 P14598 2/20 0.38
TUBB4A P04350 1/20 0.38
TUBB P07437 1/20 0.38
TUBA3C P0DPH7 1/20 0.38
TUBA1B P68363 1/20 0.38
TUBA4A P68366 1/20 0.38
TUBB4B P68371 1/20 0.38
TUBB3 Q13509 1/20 0.38
TUBB2A Q13885 1/20 0.38
TUBB8 Q3ZCM7 1/20 0.38
TUBA3E Q6PEY2 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3625535 0.86 RELA (0.50) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL1796680 0.86 CHRNA7 (0.54) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL3902755 0.86 NCF1 (0.54) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL283100 0.83 TRPA1 (0.39) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL3629029 0.83 RELA (0.47) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL3624946 0.83 RELA (0.47) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL3901025 0.83 NCF1 (0.51) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL7639908 0.82 KDM4E (0.44) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL6154744 0.78 ESR1 (0.39) CHRNA7CHRNB4CHRNA3CHRNB2CHRNA4
SCHEMBL27938239 0.78 MAPK1 (0.58) CHRNA7CHRNB4CHRNA3MAPTNPC1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 30 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10719014-B2 Photoresists comprising amide component ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2020-07-21 US disclosed
US-9541834-B2 Ionic thermal acid generators for low temperature applications ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2017-01-10 US disclosed
US-9298093-B2 Polymers, photoresist compositions and methods of forming photolithographic patterns ROHM AND HAAS ELECTRONIC MATERIALS LLC 2016-03-29 US disclosed
US-20150212414-A1 IONIC THERMAL ACID GENERATORS FOR LOW TEMPERATURE APPLICATIONS ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2015-07-30 US disclosed
US-8975001-B2 Photoresist compositions and methods of forming photolithographic patterns ROHM AND HAAS ELECTRONICS MATERIALS LLC (US) 2015-03-10 US disclosed
US-8790867-B2 Methods of forming photolithographic patterns by negative tone development ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2014-07-29 US disclosed
US-8771917-B2 Monomers, polymers, photoresist compositions and methods of forming photolithographic patterns ROHM AND HAAS ELECTRONICS MATERIALS LLC (US) 2014-07-08 US disclosed
US-20140120469-A1 THERMAL ACID GENERATORS FOR USE IN PHOTORESIST ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2014-05-01 US disclosed
US-20140120470-A1 PHOTORESISTS COMPRISING IONIC COMPOUND ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2014-05-01 US disclosed
US-20130344439-A1 PHOTORESISTS COMPRISING AMIDE COMPONENT U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT 2013-12-26 US disclosed
EP-2492749-A1 Photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-08-29 EP disclosed
US-20120171617-A1 POLYMERS, PHOTORESIST COMPOSITIONS AND METHODS OF FORMING PHOTOLITHOGRAPHIC PATTERNS DOW GLOBAL TECHNOLOGIES LLC (US) 2012-07-05 US disclosed
EP-2472325-A1 Polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-07-04 EP disclosed
EP-2472326-A1 Polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-07-04 EP disclosed
EP-2472324-A1 Monomers, polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-07-04 EP disclosed
EP-2461213-A1 Polymers, photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-06-06 EP disclosed
US-20120077120-A1 PHOTORESISTS COMPRISING MULTI-AMIDE COMPONENT ROHM AND HAAS ELECTRONIC MATERIALS LLC (US) 2012-03-29 US disclosed
US-20120064456-A1 PHOTORESIST COMPOSITIONS AND METHODS OF FORMING PHOTOLITHOGRAPHIC PATTERNS DOW GLOBAL TECHNOLOGIES LLC (US) 2012-03-15 US disclosed
EP-2428843-A1 Photoresist compositions and methods of forming photolithographic patterns Rohm and Haas Electronic Materials LLC (US) 2012-03-14 EP disclosed
EP-2428842-A1 Photoresists comprising multi-amide component Rohm and Haas Electronic Materials LLC (US) 2012-03-14 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-10719014-B2 Photoresists comprising amide component ASPH, ALAD, SUN2 CHRNA7 4600/4885CHRNB4 4598/4885CHRNA3 4619/4885
US-20150212414-A1 IONIC THERMAL ACID GENERATORS FOR LOW TEMPERATURE APPLICATIONS TRIM4, TRMT1, TRIM59 CHRNA7 657/4885CHRNB4 1725/4885CHRNA3 508/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.