SCHEMBL3144816

SCHEMBL3144816

CCO[Si](OCC)(OCC)C(C)CCNC(N)=O

nearest known ligand 0.32

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
CHRNB2 P17787 1/20 0.31
CHRNB4 P30926 1/20 0.31
CHRNA3 P32297 1/20 0.31
CHRNA4 P43681 1/20 0.31
HTT P42858 1/20 0.31
ANPEP P15144 2/20 0.30
RNPEP Q9H4A4 2/20 0.30
ALDH1A1 P00352 1/20 0.30
DNPEP Q9ULA0 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3155313 0.87 CHRNB2 (0.36) CHRNB2CHRNB4CHRNA3CHRNA4
SCHEMBL3476847 0.84 EPHX1 (0.43) CHRNB2CHRNB4CHRNA3CHRNA4
SCHEMBL18271650 0.84 ALOX15 (0.30)
SCHEMBL4544298 0.84 CYP2D6 (0.36) CHRNB2CHRNB4CHRNA3CHRNA4
SCHEMBL1720124 0.83 CAD (0.31)
SCHEMBL1142593 0.82 BCAT2 (0.33) HTT
SCHEMBL3158558 0.82 MTNR1A (0.33) CHRNB2CHRNB4CHRNA4ANPEPRNPEP
SCHEMBL1142597 0.76
SCHEMBL2261531 0.75
SCHEMBL27822111 0.75 CHRNB2 (0.50) CHRNB2CHRNB4CHRNA3CHRNA4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 71 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2026100338-A1 PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING CURED RELIEF PATTERN 旭化成株式会社 2026-05-15 WO disclosed
US-12613465-B2 Photosensitive resin composition and method for producing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2026-04-28 US disclosed
US-20260099093-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN USING SAME, AND METHOD FOR PRODUCING POLYIMIDE FILM USING SAME ASAHI KASEI KABUSHIKI KAISHA (JP) 2026-04-09 US disclosed
US-12504688-B2 Negative photosensitive resin composition and method for manufacturing cured relief pattern ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-12-23 US disclosed
US-20250370339-A1 NEGATIVE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR MANUFACTURING CURED RELIEF PATTERN ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-12-04 US disclosed
US-20250341778-A1 NEGATIVE-TYPE PHOTOSENSITIVE RESIN COMPOSITION AND METHOD FOR PRODUCING POLYIMIDE AND CURED RELIEF PATTERN USING SAME ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-11-06 US disclosed
US-12386259-B2 Negative-type photosensitive resin composition and method for producing polyimide and cured relief pattern using same ASAHI KASEI KABUSHIKI KAISHA (JP) 2025-08-12 US disclosed
CN-120153318-A Photosensitive resin composition, method for producing cured relief pattern using same, and method for producing polyimide film 旭化成株式会社 2025-06-13 CN disclosed
WO-2024225072-A1 PHOTOSENSITIVE RESIN COMPOSITION, PRODUCTION METHOD FOR CURED RELIEF PATTERN, AND CURED FILM 旭化成株式会社 2024-10-31 WO disclosed
WO-2024210063-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN, CURED FILM, AND SEMICONDUCTOR DEVICE 旭化成株式会社 2024-10-10 WO disclosed
CN-102047178-B Photosensitive resin composition ASAHI KASEI E MATERIALS CORP 2014-05-28 CN disclosed
CN-102047179-B Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device ASAHI KASEI E MATERIALS CORP 2014-02-26 CN disclosed
CN-102439520-A Photosensitive resin composition ASAHI KASEI E MATERIALS CORP 2012-05-02 CN disclosed
CN-102047179-A Photosensitive resin composition, method for producing cured relief pattern, and semiconductor device ASAHI KASEI E MATERIALS CORP 2011-05-04 CN disclosed
CN-102047178-A Photosensitive resin composition ASAHI KASEI E MATERIALS CORP 2011-05-04 CN disclosed
CN-101993537-A Alkali-soluble polymer, photosensitive resin composition comprising the same, and uses of the same ASAHI KASEI E MATERIALS CORP 2011-03-30 CN disclosed
US-7687208-B2 Positive photosensitive resin composition ASAHI KASEI EMD CORPORATION (JP) 2010-03-30 US disclosed
US-20090202794-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION ASAHI KASEI EMD CORPORATION (JP) 2009-08-13 US disclosed
CN-101495919-A Positive photosensitive resin composition ASAHI KASEI EMD CORP (JP) 2009-07-29 CN disclosed
EP-2056163-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION Asahi Kasei EMD Corporation (JP) 2009-05-06 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-12613465-B2 Photosensitive resin composition and method for producing cured relief pattern ARCN1, GLRA1, PSMA1 CHRNB2 3898/4885CHRNB4 3816/4885CHRNA3 3208/4885
US-20260099093-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR PRODUCING CURED RELIEF PATTERN USING SAME, AND METHOD FOR PRODUCING POLYIMIDE FILM USING SAME CD79B, ITGA1, PTK2 CHRNB2 2637/4885CHRNB4 3284/4885CHRNA3 2758/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.