Trifluoromethanesulfonic Acid

Trifluoromethanesulfonic Acid

SCHEMBL4187466

O=S(=O)([O-])C(F)(F)F.Oc1ccc2ccccc2c1C[S+]1CCCC1

nearest known ligand 0.43

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Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
HSD17B10 Q99714 4/20 0.43
CYP1A2 P05177 3/20 0.43
CYP2C9 P11712 2/20 0.43
CYP2C19 P33261 2/20 0.43
KDM4E B2RXH2 9/20 0.42
MAPT P10636 8/20 0.42
ALDH1A1 P00352 7/20 0.42
GAA P10253 4/20 0.42
HPGD P15428 2/20 0.42
GLA P06280 1/20 0.42
TAAR1 Q96RJ0 1/20 0.41
CRHBP P24387 1/20 0.41
CRHR2 Q13324 1/20 0.41
CYP2D6 P10635 2/20 0.39
HIF1A Q16665 2/20 0.39
TDP1 Q9NUW8 3/20 0.39
KMT2A Q03164 7/20 0.37
MEN1 O00255 4/20 0.37
HTT P42858 1/20 0.36
ERN1 O75460 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Trifluoromethanesulfonic Acid SCHEMBL17182745 0.82 HSD17B10 (0.50) HSD17B10CYP1A2CYP2C9CYP2C19KDM4E
Trifluoromethanesulfonic Acid SCHEMBL29625806 0.73 PTPN1 (0.43) HSD17B10CYP1A2CYP2C9KDM4EMAPT
Trifluoromethanesulfonic Acid SCHEMBL3872598 0.73 PTPN1 (0.43) HSD17B10CYP1A2CYP2C9KDM4EMAPT
Trifluoromethanesulfonic Acid SCHEMBL847347 0.73 GPR3 (0.40) HPGD
Trifluoromethanesulfonic Acid SCHEMBL31603622 0.72 TDP1 (0.43) KDM4EALDH1A1HPGDTDP1KMT2A
Trifluoromethanesulfonic Acid SCHEMBL515772 0.72 TDP1 (0.43) KDM4EALDH1A1HPGDTDP1KMT2A
Trifluoromethanesulfonic Acid SCHEMBL926342 0.71 ALDH1A1 (0.43) HSD17B10CYP1A2CYP2C9KDM4EMAPT
Trifluoromethanesulfonic Acid SCHEMBL31168280 0.70 LDHA (0.37) HSD17B10MAPTALDH1A1GAAHPGD
Trifluoromethanesulfonic Acid SCHEMBL515598 0.70 LDHA (0.37) HSD17B10MAPTALDH1A1GAAHPGD
Trifluoromethanesulfonic Acid SCHEMBL12499000 0.70 LMNA (0.38) ALDH1A1GAATAAR1KMT2AMEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 28 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7625689-B2 better line edge roughness in excimer laser lithography; supramolecule ester useful in photoresists e.g. pentaerythritol, tetrakis(3-(methoxymethyloxycarbonyl)cyclohexanecarboxylate) aka PECHOM and other adamantanyl and norbornyl derivatives SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-12-01 US disclosed
US-7556908-B2 Chemically amplified positive resist composition, (meth)acrylate derivative and a process for producing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-07-07 US disclosed
US-7423102-B2 Star polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-09-09 US disclosed
US-7232642-B2 Chemically amplified positive resist composition, a haloester derivative and a process for producing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-06-19 US disclosed
US-7202010-B2 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY LIMITED (JP) 2007-04-10 US disclosed
US-7144674-B2 Positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-12-05 US disclosed
US-7129014-B2 Positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-10-31 US disclosed
US-20060160017-A1 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-07-20 US disclosed
US-20060073411-A1 Chemically amplified resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-04-06 US disclosed
US-20060014913-A1 Star polymer SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-01-19 US disclosed
US-6689531-B2 NOVOLAK PHOTORESISTS WITH IMPROVED ADHESION AT THE INTERFACE OF A SUBSTRATE; WET ETCHING, PHOTOSENSITIVITY, RESOLUTION AND HEAT RESISTANCE SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2004-02-10 US disclosed
US-20030236351-A1 Positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITIED (JP) 2003-12-25 US disclosed
US-20030219677-A1 Positive resist composition SUMITOMO CHEMICAL COMPANY (JP) 2003-11-27 US disclosed
US-20030194639-A1 Positive resist composition FORTINET, INC. 2003-10-16 US disclosed
US-20030180659-A1 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-09-25 US disclosed
US-20030180663-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY (JP) 2003-09-25 US disclosed
US-20030119957-A1 Resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-06-26 US disclosed
US-20030114589-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-06-19 US disclosed
US-20030104312-A1 Positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2003-06-05 US disclosed
US-20030099900-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY LIMITED (JP) 2003-05-29 US disclosed