SCHEMBL454651

SCHEMBL454651

C=CC(=O)OC1C2CC3CC(C2)CC1(O)C3

nearest known ligand 0.30

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
THRB P10828 2/20 0.30
ALDH1A1 P00352 1/20 0.30
LMNA P02545 1/20 0.30
HTT P42858 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30
CYP2C9 P11712 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL30185994 0.84
SCHEMBL284285 0.82
SCHEMBL7036978 0.82
SCHEMBL3953939 0.81 THRB (0.32) THRBCYP2C9
SCHEMBL19619432 0.81
SCHEMBL21247654 0.79 MEN1 (0.33) THRBALDH1A1
SCHEMBL451377 0.78 ALDH1A1 (0.31) THRBALDH1A1LMNAHTTSMN1; SMN2
SCHEMBL3858084 0.78 DPP4 (0.30)
SCHEMBL7185948 0.76
SCHEMBL108706 0.75 ALDH1A1 (0.33) ALDH1A1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 115 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1551887-A4 FLUORINATED POLYMERS, PHOTORESISTS AND PROCESSES FOR MICROLITHOGRAPHY DU PONT (US) 2008-07-02 EP claimed
US-20050203262-A1 Fluorinated polymers, photoresists and processes for microlithography E. I. DU PONT DE NEMOURS AND COMPANY 2005-09-15 US claimed
EP-1551887-A1 FLUORINATED POLYMERS, PHOTORESISTS AND PROCESSES FOR MICROLITHOGRAPHY E. I. du Pont de Nemours and Company (US) 2005-07-13 EP claimed
WO-2004011509-A1 FLUORINATED POLYMERS, PHOTORESISTS AND PROCESSES FOR MICROLITHOGRAPHY E. I. DU PONT DE NEMOURS AND COMPANY (US) 2004-02-05 WO claimed
US-12264073-B2 Composite material ADEKA CORPORATION (JP) 2025-04-01 US disclosed
CN-117924568-A High refractive index encapsulation composition and application thereof 武汉柔显科技股份有限公司 2024-04-26 CN disclosed
US-20240124632-A1 Method for Producing Fluorine-Containing Polymer and Composition CENTRAL GLASS COMPANY, LIMITED (JP) 2024-04-18 US disclosed
US-20240043593-A1 Fluorine-Containing Polymer CENTRAL GLASS COMPANY, LIMITED (JP) 2024-02-08 US disclosed
WO-2023190605-A1 COMPOSITE MATERIAL AND METHOD FOR PRODUCING SAME, AND CROSSLINKING AGENT 国立大学法人大阪大学 2023-10-05 WO disclosed
WO-2023171709-A1 RESIN COMPOSITION AND METHOD FOR PRODUCING SAME 国立大学法人大阪大学 2023-09-14 WO disclosed
US-11597696-B2 Method for purifying polymerizable fluoromonomer by distillation CENTRAL GLASS COMPANY, LIMITED (JP) 2023-03-07 US disclosed
WO-2023003043-A1 SILICONE-BASED POLYMER COMPOUND AND SILICONE-BASED POLYMER MATERIAL 国立大学法人大阪大学 2023-01-26 WO disclosed
US-20030149225-A1 Resin useful for resist, resist composition and pattern forming process using the same KABUSHIKI KAISHA TOSHIBA (JP) 2003-08-07 US disclosed
US-6541597-B2 Resist resin having in its structure a bridged bond containing aliphatic ring; pattern excellent in transparency against short wavelength light and dry-etching resistance can be formed by alkali development with high resolution. KABUSHIKI KAISHA TOSHIBA (JP) 2003-04-01 US disclosed
US-20020132181-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2002-09-19 US disclosed
US-20020098441-A1 Resin useful for resist, resist composition and pattern forming process using the same KABUSHIKI KAISHA TOSHIBA (JP) 2002-07-25 US disclosed
EP-1225480-A2 Radiation-sensitive resin composition JSR Corporation (JP) 2002-07-24 EP disclosed
US-6303266-B1 FOR PATTERN HAVING TRANSPARENCY AGAINST SHORT-WAVELENGTH LIGHT AND DRY-ETCHING RESISTANCE CAN BE FORMED BY ALKALI DEVELOPMENT WITH HIGH RESOLUTION KABUSHIKI KAISHA TOSHIBA (JP) 2001-10-16 US disclosed
EP-1085003-A1 HIGH-PURITY 1,3-PROPANEDIOL DERIVATIVE SOLVENT, PROCESS FOR PRODUCING THE SAME, AND USE THEREOF DAICEL CHEMICAL INDUSTRIES, Ltd. (JP) 2001-03-21 EP disclosed
EP-0936504-A1 A radiation-sensitive material and a method for forming a pattern therewith Daicel Chemical Industries, Ltd. (JP) 1999-08-18 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11597696-B2 Method for purifying polymerizable fluoromonomer by distillation AFF1, AFF4, AFF2 THRB 1246/4885ALDH1A1 950/4885LMNA 1385/4885
US-20240124632-A1 Method for Producing Fluorine-Containing Polymer and Composition PFAS, AFF2, AFF1 THRB 2068/4885ALDH1A1 865/4885LMNA 2606/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.