SCHEMBL515601

SCHEMBL515601

O=S(=O)([O-])C(F)(F)CC12CC3CC(CC(C3)C1)C2.c1ccc([S+](c2ccccc2)c2ccccc2)cc1

nearest known ligand 0.37

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
P2RX7 Q99572 7/20 0.37
EPHX2 P34913 3/20 0.34
KMT2A Q03164 3/20 0.34
MEN1 O00255 2/20 0.34
CA12 O43570 1/20 0.32
CA9 Q16790 1/20 0.32
NPC1 O15118 1/20 0.32
RAB9A P51151 1/20 0.32
SMN1; SMN2 Q16637 1/20 0.32
CA2 P00918 1/20 0.32
CYP11B1 P15538 1/20 0.32
CYP11B2 P19099 1/20 0.32
HSD11B1 P28845 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL29407108 0.87
SCHEMBL3785562 0.81 GRIN2D (0.34) EPHX2CA12CA9CA2
SCHEMBL10322932 0.80 ALDH1A1 (0.33) P2RX7EPHX2KMT2ANPC1RAB9A
Carbon Monoxide SCHEMBL544305 0.79 MMP2 (0.31) SMN1; SMN2
SCHEMBL544306 0.77 ALDH1A1 (0.43) KMT2ASMN1; SMN2HSD11B1
SCHEMBL242790 0.77 P2RX7 (0.36) P2RX7EPHX2KMT2AMEN1CA12
SCHEMBL2570105 0.77 P2RX7 (0.36) P2RX7EPHX2KMT2AMEN1CA12
SCHEMBL893149 0.76
SCHEMBL16330887 0.74 P2RX7 (0.40) P2RX7EPHX2KMT2AMEN1CA12
SCHEMBL31676706 0.73 ALDH1A1 (0.39) KMT2AMEN1NPC1RAB9ASMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 96 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-12560866-B2 Radiation-sensitive resin composition, method of forming resist pattern, polymer, and compound JSR CORPORATION (JP) 2026-02-24 US disclosed
US-12386260-B2 Radiation-sensitive resin composition, method of forming resist pattern, polymer, and compound JSR CORPORATION (JP) 2025-08-12 US disclosed
US-20220299873-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMER, AND COMPOUND JSR CORPORATION (JP) 2022-09-22 US disclosed
US-20220229367-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMER, AND COMPOUND JSR CORPORATION (JP) 2022-07-21 US disclosed
US-20210181627-A1 PATTERN-FORMING METHOD AND RADIATION-SENSITIVE COMPOSITION JSR CORPORATION (JP) 2021-06-17 US disclosed
US-20210063872-A1 PATTERN-FORMING METHOD AND RADIATION-SENSITIVE COMPOSITION JSR CORPORATION (JP) 2021-03-04 US disclosed
EP-3229075-B1 PHOTORESIST COMPOSITION, METHOD FOR MANUFACTURING SAME, AND METHOD FOR FORMING RESIST PATTERN JSR CORP (JP) 2021-01-06 EP disclosed
US-20200387068-A1 RADIATION-SENSITIVE COMPOSITION, PATTERN-FORMING METHOD AND COMPOUND JSR CORPORATION (JP) 2020-12-10 US disclosed
US-20200333707-A1 RESIST PATTERN-FORMING METHOD, AND RADIATION-SENSITIVE COMPOSITION AND PRODUCTION METHOD THEREOF JSR CORPORATION (JP) 2020-10-22 US disclosed
US-10725376-B2 Pattern-forming method JSR CORPORATION (JP) 2020-07-28 US disclosed
US-20120148952-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND COMPOUND JSR CORPORATION (JP) 2012-06-14 US disclosed
EP-2444845-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR Corporation (JP) 2012-04-25 EP disclosed
US-20120082934-A1 RADIATION-SENSITIVE RESIN COMPOSITION, POLYMER AND COMPOUND JSR CORPORATION (JP) 2012-04-05 US disclosed
US-20120082935-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST FILM FORMED USING THE SAME JSR CORPORATION (JP) 2012-04-05 US disclosed
US-20120082936-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2012-04-05 US disclosed
US-20120028189-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND COMPOUND JSR CORPORATION (JP) 2012-02-02 US disclosed
US-20100285405-A1 RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2010-11-11 US disclosed
US-20100221659-A1 COMPOUND, SALT, AND RADIATION-SENSITIVE RESIN COMPOSITION JSR CORPORATION (JP) 2010-09-02 US disclosed
EP-1873143-B1 A salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL CO (JP) 2009-04-15 EP disclosed
EP-1873143-A1 A salt suitable for an acid generator and a chemically amplified resist composition containing the same Sumitomo Chemical Company, Limited (JP) 2008-01-02 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (7 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20120148952-A1 RADIATION-SENSITIVE RESIN COMPOSITION AND COMPOUND RAD1, RER1, RPA1 P2RX7 2884/4885EPHX2 151/4885KMT2A 820/4885
US-20120082934-A1 RADIATION-SENSITIVE RESIN COMPOSITION, POLYMER AND COMPOUND RER1, RFT1, RAD51 P2RX7 2086/4885EPHX2 1930/4885KMT2A 2095/4885
US-20100221659-A1 COMPOUND, SALT, AND RADIATION-SENSITIVE RESIN COMPOSITION AFF1, RER1, AFF4 P2RX7 3746/4885EPHX2 3205/4885KMT2A 683/4885
US-20120028189-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND COMPOUND RER1, RAD51, TERB1 P2RX7 1418/4885EPHX2 619/4885KMT2A 1051/4885
US-20210181627-A1 PATTERN-FORMING METHOD AND RADIATION-SENSITIVE COMPOSITION RIF1, AP3M1, MRE11 P2RX7 4716/4885EPHX2 4652/4885KMT2A 1063/4885
US-12560866-B2 Radiation-sensitive resin composition, method of forming resist pattern, polymer, and compound RAD51, RER1, RAD1 P2RX7 2829/4885EPHX2 752/4885KMT2A 2433/4885
US-20220299873-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD OF FORMING RESIST PATTERN, POLYMER, AND COMPOUND RER1, RAD51, RFT1 P2RX7 2848/4885EPHX2 1704/4885KMT2A 1452/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.