SCHEMBL706767

SCHEMBL706767

CC(=O)O[Si](C)(C)c1ccc([Si](C)(C)OC(C)=O)cc1

nearest known ligand 0.38

Predicted protein targets (top 8)

geneUniProtsupporting neighboursconfidence
HPGD P15428 2/20 0.38
LMNA P02545 1/20 0.33
ALDH1A1 P00352 4/20 0.31
MAPT P10636 3/20 0.31
TSHR P16473 1/20 0.30
POLB P06746 1/20 0.30
PKM P14618 1/20 0.30
RAB9A P51151 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL475950 0.91 LMNA (0.47) HPGDLMNAALDH1A1MAPTPKM
SCHEMBL475969 0.89 MAPT (0.43) HPGDALDH1A1MAPTTSHRPOLB
SCHEMBL21522355 0.88 LMNA (0.53) LMNAALDH1A1MAPTTSHRPOLB
SCHEMBL7858656 0.84 ALDH1A1 (0.39) LMNAALDH1A1MAPTTSHR
SCHEMBL705277 0.80 HPGD (0.38) HPGDLMNAALDH1A1MAPTTSHR
SCHEMBL706708 0.77 HPGD (0.34) HPGDLMNAALDH1A1MAPTTSHR
SCHEMBL475949 0.72 ALDH1A1 (0.37) HPGDLMNAALDH1A1PKM
SCHEMBL705706 0.71 TSHR (0.33) HPGDLMNATSHR
SCHEMBL705215 0.71 ESR1 (0.37) HPGDLMNAALDH1A1TSHRPOLB
SCHEMBL1719096 0.70 ELANE (0.45) HPGDLMNAALDH1A1MAPTTSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 4 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8124239-B2 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2012-02-28 US disclosed
US-20100155121-A1 SILICA FILM FORMING MATERIAL, SILICA FILM AND METHOD OF MANUFACTURING THE SAME, MULTILAYER WIRING STRUCTURE AND METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME FUJITSU LIMITED (JP) 2010-06-24 US disclosed
US-7659357-B2 Precursor organosilicon polymer of 1,2-Bis(dimethylethoxysilyl)ethane, 1,4-bis(dimethylethoxysilyl)benzene, tetraethoxysilane, methyltriethoxysilane, phenyltriethoxysilane; dielectric (DE) films having etching/chemical/moisture resistance; adhesion; low DE constant; minimal wiring delay; high speed FUJITSU LIMITED (JP) 2010-02-09 US disclosed
US-20070026689-A1 Silica film forming material, silica film and method of manufacturing the same, multilayer wiring structure and method of manufacturing the same, and semiconductor device and method of manufacturing the same FUJITSU LIMITED (JP) 2007-02-01 US disclosed