SCHEMBL75391

SCHEMBL75391

CC(CCC(=O)O)(c1ccccc1)c1ccccc1

nearest known ligand 0.72

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 4/20 0.72
ESR1 P03372 1/20 0.72
CYP3A4 P08684 1/20 0.72
ESR2 Q92731 1/20 0.72
HIF1A Q16665 2/20 0.56
TSHR P16473 2/20 0.56
CYP2C9 P11712 1/20 0.56
HSD17B10 Q99714 1/20 0.56
CHEK1 O14757 1/20 0.56
FYN P06241 1/20 0.56
PDGFRB P09619 1/20 0.56
PIM1 P11309 1/20 0.56
FGFR1 P11362 1/20 0.56
FLT1 P17948 1/20 0.56
GRK5 P34947 1/20 0.56
MAP2K2 P36507 1/20 0.56
MAPK8 P45983 1/20 0.56
CDK8 P49336 1/20 0.56
RPS6KA3 P51812 1/20 0.56
PRKX P51817 1/20 0.56

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28393601 0.88 ALDH1A1 (0.58) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL2095353 0.84 CYP3A4 (0.53) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL75695 0.84 ESR1 (1.00) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL5936700 0.84 ALDH1A1 (0.73) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL1682512 0.83 HIF1A (0.53) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL5329346 0.83 KIF11 (0.53) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL3228621 0.82 CYP2C19 (0.52) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL7127992 0.82 CYP2C19 (0.52) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL7125049 0.82 CYP2C19 (0.52) ALDH1A1ESR1CYP3A4ESR2HIF1A
SCHEMBL8698880 0.81 ALDH1A1 (0.50) ALDH1A1ESR1CYP3A4ESR2HIF1A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 251 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2000851-B1 Photomask blank, resist pattern forming process, and photomask preparation process SHINETSU CHEMICAL CO (JP) 2015-07-29 EP disclosed
US-8968979-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-03 US disclosed
US-8968979-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-03 US disclosed
US-8795942-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-05 US disclosed
US-8795942-B2 Positive resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-08-05 US disclosed
US-8741548-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-06-03 US disclosed
US-8741548-B2 Patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-06-03 US disclosed
US-8420290-B2 Acetal compounds and their preparation, polymers, resist compositions and patterning process SHIN-ETSU CHEMICAL CO., LTD (JP) 2013-04-16 US disclosed
US-8343694-B2 Photomask blank, resist pattern forming process, and photomask preparation process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-01 US disclosed
US-8343694-B2 Photomask blank, resist pattern forming process, and photomask preparation process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2013-01-01 US disclosed
US-20070020540-A1 Silane-phenol compound, overcoat formulation, and electrophotographic imaging member XEROX CORPORATION 2007-01-25 US disclosed
US-20070020540-A1 Silane-phenol compound, overcoat formulation, and electrophotographic imaging member XEROX CORPORATION 2007-01-25 US disclosed
US-20070020539-A1 Imaging member XEROX CORPORATION 2007-01-25 US disclosed
US-20070020539-A1 Imaging member XEROX CORPORATION 2007-01-25 US disclosed
US-20070015072-A1 Imaging members XEROX CORPORATION 2007-01-18 US disclosed
US-20070015072-A1 Imaging members XEROX CORPORATION 2007-01-18 US disclosed
EP-1744220-A2 Imaging Members Xerox Corporation (US) 2007-01-17 EP disclosed
US-7157207-B2 Polymer, resist material and patterning processing SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-01-02 US disclosed
US-7157207-B2 Polymer, resist material and patterning processing SHIN-ETSU CHEMICAL CO., LTD. (JP) 2007-01-02 US disclosed
EP-0646568-B1 Tertiary butyl 4,4-bis(4'-hydroxyphenyl) pentanoate derivatives and positive resist materials containing the same SHINETSU CHEMICAL CO (JP) 1998-12-23 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (1 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20070020540-A1 Silane-phenol compound, overcoat formulation, and electrophotographic imaging member ARNT, STUB1, FLOT1 ALDH1A1 1207/4885ESR1 466/4885CYP3A4 2978/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.