SCHEMBL892052

SCHEMBL892052

COC(=O)C(F)(F)C(O)C(C)C

nearest known ligand 0.39

Predicted protein targets (top 4)

geneUniProtsupporting neighboursconfidence
CTRB1 P17538 1/20 0.36
SMN1; SMN2 Q16637 1/20 0.33
ALDH1A1 P00352 1/20 0.32
DGAT1 O75907 1/20 0.32

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL892136 0.87 CTRB1 (0.31) CTRB1
SCHEMBL12869242 0.79 CTRB1 (0.37) CTRB1SMN1; SMN2ALDH1A1DGAT1
SCHEMBL21375478 0.78 CTRB1 (0.39) CTRB1SMN1; SMN2ALDH1A1DGAT1
SCHEMBL11216608 0.78 CTRB1 (0.39) CTRB1SMN1; SMN2ALDH1A1DGAT1
SCHEMBL765780 0.78 DGAT1 (0.41) CTRB1SMN1; SMN2ALDH1A1DGAT1
SCHEMBL17898134 0.77 MMP8 (0.40) ALDH1A1
SCHEMBL10601712 0.76 CTRB1 (0.38) CTRB1ALDH1A1DGAT1
SCHEMBL12869260 0.76 CTRB1 (0.35) CTRB1SMN1; SMN2ALDH1A1DGAT1
SCHEMBL17067292 0.75 CTRB1 (0.40) CTRB1SMN1; SMN2ALDH1A1DGAT1
SCHEMBL12886375 0.74 CTRB1 (0.37) CTRB1SMN1; SMN2ALDH1A1DGAT1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 26 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9500949-B2 Chemically-amplified positive resist composition and resist patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-11-22 US disclosed
US-9500949-B2 Chemically-amplified positive resist composition and resist patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-11-22 US disclosed
US-9500949-B2 Chemically-amplified positive resist composition and resist patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-11-22 US disclosed
US-9436083-B2 Chemically-amplified negative resist composition and resist patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-09-06 US disclosed
US-9436083-B2 Chemically-amplified negative resist composition and resist patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-09-06 US disclosed
US-9436083-B2 Chemically-amplified negative resist composition and resist patterning process using the same SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-09-06 US disclosed
US-9261783-B2 Fluorinated ester monomer, making method, fluorinated ester polymer, and difluorohydroxycarboxylic acid SHIN-ETSU CHEMICAL CO., LTD. (JP) 2016-02-16 US disclosed
US-9221742-B2 Sulfonium salt, chemically amplified resist composition, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-29 US disclosed
US-9221742-B2 Sulfonium salt, chemically amplified resist composition, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-29 US disclosed
US-9221742-B2 Sulfonium salt, chemically amplified resist composition, and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-12-29 US disclosed
US-20150086926-A1 SULFONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-26 US disclosed
US-20150086926-A1 SULFONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-26 US disclosed
US-20150086926-A1 SULFONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2015-03-26 US disclosed
US-8697903-B2 Fluorinated ester monomer, making method, fluorinated ester polymer, and difluorohydroxycarboxylic acid SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-04-15 US disclosed
US-20140051024-A1 FLUORINATED ESTER MONOMER, MAKING METHOD, FLUORINATED ESTER POLYMER, AND DIFLUOROHYDROXYCARBOXYLIC ACID SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-20 US disclosed
US-20140051024-A1 FLUORINATED ESTER MONOMER, MAKING METHOD, FLUORINATED ESTER POLYMER, AND DIFLUOROHYDROXYCARBOXYLIC ACID SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-20 US disclosed
US-20140051024-A1 FLUORINATED ESTER MONOMER, MAKING METHOD, FLUORINATED ESTER POLYMER, AND DIFLUOROHYDROXYCARBOXYLIC ACID SHIN-ETSU CHEMICAL CO., LTD. (JP) 2014-02-20 US disclosed
US-20120083580-A1 FLUORINATED ESTER MONOMER, MAKING METHOD, FLUORINATED ESTER POLYMER, AND DIFLUOROHYDROXYCARBOXYLIC ACID SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-04-05 US disclosed
US-20120083580-A1 FLUORINATED ESTER MONOMER, MAKING METHOD, FLUORINATED ESTER POLYMER, AND DIFLUOROHYDROXYCARBOXYLIC ACID SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-04-05 US disclosed
US-20120083580-A1 FLUORINATED ESTER MONOMER, MAKING METHOD, FLUORINATED ESTER POLYMER, AND DIFLUOROHYDROXYCARBOXYLIC ACID SHIN-ETSU CHEMICAL CO., LTD. (JP) 2012-04-05 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20150086926-A1 SULFONIUM SALT, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERN FORMING PROCESS CA2, CASR, CECR2 CTRB1 2722/4885SMN1; SMN2 1267/4885ALDH1A1 4260/4885
US-20120083580-A1 FLUORINATED ESTER MONOMER, MAKING METHOD, FLUORINATED ESTER POLYMER, AND DIFLUOROHYDROXYCARBOXYLIC ACID ARF1, FFAR3, RFC3 CTRB1 1692/4885SMN1; SMN2 3516/4885ALDH1A1 1164/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.