SCHEMBL10475855

SCHEMBL10475855

C=C(C)C(=O)OC(C(=O)O)C(F)(F)F

nearest known ligand 0.38

Predicted protein targets (top 2)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 1/20 0.38
TSHR P16473 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL5855680 0.82 ALDH1A1 (0.39) ALDH1A1TSHR
SCHEMBL20924749 0.79 ALDH1A1 (0.34) ALDH1A1TSHR
SCHEMBL8596374 0.79 TSHR (0.40) TSHR
SCHEMBL17476047 0.79 TSHR (0.40) TSHR
SCHEMBL10475813 0.78 THRB (0.41) ALDH1A1TSHR
SCHEMBL20457124 0.78 ALDH1A1 (0.31) ALDH1A1
Hydrochloric Acid SCHEMBL9300845 0.77 TSHR (0.39) TSHR
SCHEMBL47311 0.77 ALDH1A1 (0.42) ALDH1A1TSHR
SCHEMBL12186492 0.77 HTT (0.44) ALDH1A1TSHR
SCHEMBL795471 0.75 TSHR (0.42) ALDH1A1TSHR

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 32 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2479614-B1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR CORP (JP) 2019-07-24 EP disclosed
EP-2781959-B1 Radiation-sensitive resin composition, method for forming resist pattern, polymer and polymerizable compound JSR CORP (JP) 2019-04-24 EP disclosed
EP-2781959-B1 Radiation-sensitive resin composition, method for forming resist pattern, polymer and polymerizable compound JSR CORP (JP) 2019-04-24 EP disclosed
CN-103472674-B Radiation-sensitive resin composition, method for forming resist pattern, polymer and polymerizable compound JSR株式会社 2017-04-26 CN disclosed
US-9513548-B2 Radiation-sensitive resin composition, method for forming resist pattern, polymer and polymerizable compound JSR CORPORATION (JP) 2016-12-06 US disclosed
US-9513548-B2 Radiation-sensitive resin composition, method for forming resist pattern, polymer and polymerizable compound JSR CORPORATION (JP) 2016-12-06 US disclosed
US-9513548-B2 Radiation-sensitive resin composition, method for forming resist pattern, polymer and polymerizable compound JSR CORPORATION (JP) 2016-12-06 US disclosed
US-20160179003-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR CORPORATION (JP) 2016-06-23 US disclosed
US-20160179003-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR CORPORATION (JP) 2016-06-23 US disclosed
US-9261780-B2 Radiation-sensitive resin composition, method for forming resist pattern, and polymer and compound JSR CORPORATION (JP) 2016-02-16 US disclosed
US-20130143160-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND POLYMER AND COMPOUND JSR CORPORATION (JP) 2013-06-06 US disclosed
US-20130143160-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND POLYMER AND COMPOUND JSR CORPORATION (JP) 2013-06-06 US disclosed
US-20130122426-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND POLYMER AND COMPOUND JSR CORPORATION (JP) 2013-05-16 US disclosed
US-20120237875-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR CORPORATION (JP) 2012-09-20 US disclosed
US-20120237875-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR CORPORATION (JP) 2012-09-20 US disclosed
US-20120237875-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR CORPORATION (JP) 2012-09-20 US disclosed
EP-2479614-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR Corporation (JP) 2012-07-25 EP disclosed
EP-2479614-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR Corporation (JP) 2012-07-25 EP disclosed
WO-2011145702-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND COMPOUND JSR株式会社 (JP) 2011-11-24 WO disclosed
WO-2011034176-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND JSR株式会社 (JP) 2011-03-24 WO disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20130122426-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, AND POLYMER AND COMPOUND RER1, RFTN1, FRG1 ALDH1A1 3926/4885TSHR 3218/4885
US-20120237875-A1 RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER AND POLYMERIZABLE COMPOUND RER1, RDX, PRXL2A ALDH1A1 1383/4885TSHR 1194/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.