SCHEMBL246867

SCHEMBL246867

c1ccc([S+](c2ccccc2)c2cccs2)cc1

nearest known ligand 0.33

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KMT2A Q03164 2/20 0.33
HPGDS O60760 1/20 0.33
MEN1 O00255 1/20 0.33
DAO P14920 1/20 0.33
FBP1 P09467 1/20 0.32
OPRM1 P35372 1/20 0.32
OPRL1 P41146 1/20 0.32
G6PC1 P35575 1/20 0.31
ALDH1A1 P00352 2/20 0.31
HPGD P15428 2/20 0.31
HTT P42858 1/20 0.31
NOS1 P29475 1/20 0.31
ERCC5 P28715 1/20 0.31
FEN1 P39748 1/20 0.31
LMNA P02545 1/20 0.31
ALOX15 P16050 1/20 0.31
CES2 O00748 1/20 0.30
CES1 P23141 1/20 0.30
NFKB1 P19838 1/20 0.30
NFKB2 Q00653 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4761802 0.95 KMT2A (0.33) KMT2AHPGDSMEN1DAOFBP1
SCHEMBL1469936 0.94 ALDH1A1 (0.32) KMT2AHPGDSMEN1DAOALDH1A1
SCHEMBL31369338 0.92 MEN1 (0.30) KMT2AMEN1
Trifluoromethanesulfonic Acid SCHEMBL6653041 0.82 GPR3 (0.40) KMT2AMEN1ALDH1A1
SCHEMBL12762162 0.82 FBP1 (0.39) KMT2AMEN1DAOFBP1ALDH1A1
Trifluoroacetic Acid SCHEMBL1470565 0.79 HDAC6 (0.37) HPGDSDAOCES1
Trifluoromethanesulfonic Acid SCHEMBL6654028 0.78 GPR3 (0.40) KMT2AMEN1
SCHEMBL1251856 0.70 MEN1 (0.32) KMT2AHPGDSMEN1DAO
SCHEMBL4763480 0.70 ALDH1A1 (0.31) KMT2AALDH1A1HPGDHTT
SCHEMBL29515962 0.70 LTA4H (0.50) KMT2AMEN1ALDH1A1HPGD

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 210 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-1710230-B1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2013-08-14 EP claimed
EP-1780199-B1 Novel fluorohydroxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2012-02-01 EP claimed
EP-1780198-B1 Novel fluorosulfonyloxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHINETSU CHEMICAL CO (JP) 2011-10-05 EP claimed
US-6696216-B2 A PHOTO ACID GENERATOR USED IN GENERATING AN ACID FOR CHEMICALLY CLEAVING ACID SENSITIVE SIDE CHAINS OF A CHEMICALLY AMPLIFIED BASE POLYMER CONTAINS A SULFONIUM OR IODONIUM SALT CONTAINING ATLEAST ONE THIOPHENE RING INTERNATIONAL BUSINESS MACHINES CORPORATION 2004-02-24 US claimed
US-20030008230-A1 Thiophene-containing photo acid generators for photolithography INTERNATIONAL BUSINESS MACHINES CORPORATION 2003-01-09 US claimed
WO-2003003120-A1 THIOPHENE-CONTAINING PHOTO ACID GENERATORS FOR PHOTOLITHOGRAPHY INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2003-01-09 WO claimed
US-20260093177-A1 PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-04-02 US disclosed
US-12535737-B2 Material for forming adhesive film, patterning process, and method for forming adhesive film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-01-27 US disclosed
EP-4674837-A1 HETEROPOLYOXOTUNGSTATE COMPOUND, SOLVATE THEREOF, OR MIXTURE OF SAID COMPOUND AND SOLVATE, AND METHOD FOR PRODUCING SAID COMPOUND, SOLVATE, OR MIXTURE Tokyo Ohka Kogyo Co., Ltd. (JP) 2026-01-07 EP disclosed
EP-4202548-B1 MATERIAL FOR FORMING ADHESIVE FILM, PATTERNING PROCESS, AND METHOD FOR FORMING ADHESIVE FILM SHINETSU CHEMICAL CO (JP) 2025-11-19 EP disclosed
EP-4635963-A1 ISOPOLYOXOTUNGSTATE SALT COMPOUND, SOLVATE THEREOF OR MIXTURE OF SAID COMPOUND AND SOLVATE, AND METHOD FOR PRODUCING SAID COMPOUND, SOLVATE OR MIXTURE TOKYO OHKA KOGYO CO., LTD. (JP) 2025-10-22 EP disclosed
US-12351742-B2 Material for forming adhesive film, patterning process, and method for forming adhesive film SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-07-08 US disclosed
US-12174536-B2 Resist composition and pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2024-12-24 US disclosed
EP-1780199-A1 Novel fluorohydroxyalkyl sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2007-05-02 EP disclosed
US-20060228648-A1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process SHIN-ETSU CHEMICAL CO., LTD. 2006-10-12 US disclosed
EP-1710230-A1 Novel sulfonate salts and derivatives, photoacid generators, resist compositions, and patterning process Shin-Etsu Chemical Co., Ltd. (JP) 2006-10-11 EP disclosed
US-20050260522-A1 Permanent resist composition, cured product thereof, and use thereof MICROCHEM CORP. 2005-11-24 US disclosed
US-6696216-B2 A PHOTO ACID GENERATOR USED IN GENERATING AN ACID FOR CHEMICALLY CLEAVING ACID SENSITIVE SIDE CHAINS OF A CHEMICALLY AMPLIFIED BASE POLYMER CONTAINS A SULFONIUM OR IODONIUM SALT CONTAINING ATLEAST ONE THIOPHENE RING INTERNATIONAL BUSINESS MACHINES CORPORATION 2004-02-24 US disclosed
US-20030008230-A1 Thiophene-containing photo acid generators for photolithography INTERNATIONAL BUSINESS MACHINES CORPORATION 2003-01-09 US disclosed
WO-2003003120-A1 THIOPHENE-CONTAINING PHOTO ACID GENERATORS FOR PHOTOLITHOGRAPHY INTERNATIONAL BUSINESS MACHINES CORPORATION (US) 2003-01-09 WO disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20260093177-A1 PATTERNING PROCESS ARFGAP1, ARF1, ARF4 KMT2A 893/4885HPGDS 3805/4885MEN1 502/4885
US-12535737-B2 Material for forming adhesive film, patterning process, and method for forming adhesive film RAD51, CDH1, SMC2 KMT2A 714/4885HPGDS 2968/4885MEN1 2010/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.