SCHEMBL3106769

SCHEMBL3106769

CCc1cccc([Si](OC)(OC)OC)c1

nearest known ligand 0.39

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
TP53 P04637 1/20 0.39
IDO1 P14902 1/20 0.38
MGLL Q99685 1/20 0.37
NISCH Q9Y2I1 1/20 0.37
ALDH1A1 P00352 3/20 0.36
KDM4E B2RXH2 2/20 0.36
PTGS2 P35354 1/20 0.36
CYP1A2 P05177 1/20 0.36
CYP2A6 P11509 1/20 0.36
SMN1; SMN2 Q16637 2/20 0.36
NPC1 O15118 1/20 0.36
LMNA P02545 1/20 0.36
MAPT P10636 1/20 0.36
MAPK1 P28482 1/20 0.36
RAB9A P51151 1/20 0.36
L3MBTL1 Q9Y468 1/20 0.36
BCL2 P10415 1/20 0.35
RAPGEF4 Q8WZA2 1/20 0.35
NOTUM Q6P988 1/20 0.35
NPBWR1 P48145 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3861937 0.82 TSHR (0.42) IDO1ALDH1A1SMN1; SMN2
SCHEMBL27608831 0.82 LOXL2 (0.46) ALDH1A1SMN1; SMN2NOS3NOS1NOS2
SCHEMBL28507332 0.82 LPL (0.42) NPC1MAPK1RAB9AL3MBTL1
SCHEMBL1223918 0.81 TAAR1 (0.37) ALDH1A1SMN1; SMN2
SCHEMBL12972144 0.80 HTR2A (0.40) ALDH1A1KDM4ECYP1A2SMN1; SMN2
SCHEMBL574627 0.80 ACHE (0.32) ALDH1A1KDM4ECYP1A2CYP2A6SMN1; SMN2
SCHEMBL1224930 0.78 ENPP2 (0.45) KDM4E
SCHEMBL675673 0.78 ALDH1A1 (0.46) TP53ALDH1A1KDM4EPTGS2CYP1A2
SCHEMBL1908544 0.77 CYP1A2 (0.45) TP53IDO1MGLLNISCHALDH1A1
SCHEMBL19484773 0.75 IDO1 (0.33) IDO1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 37 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
WO-2024190380-A1 SILICON-CONTAINING RESIN COMPOSITION PURIFIED PRODUCT MANUFACTURING METHOD, PATTERN FORMATION METHOD, AND SILICON-CONTAINING RESIN COMPOSITION PURIFIED PRODUCT 東京応化工業株式会社 2024-09-19 WO disclosed
CN-117916299-A Zirconia and titania formulations and nanocomposites for nanoimprint lithography PT SPE塞博康有限责任公司 2024-04-19 CN disclosed
CN-112142660-B Method for simply, conveniently and efficiently synthesizing 4-aryl butyric acid derivative 淮阴师范学院 2021-11-23 CN disclosed
US-20160320705-A1 RESIST PATTERN-FORMING METHOD JSR CORPORATION (JP) 2016-11-03 US disclosed
US-9434609-B2 Method for forming pattern, and polysiloxane composition JSR CORPORATION (JP) 2016-09-06 US disclosed
US-9329478-B2 Polysiloxane composition and pattern-forming method JSR CORPORATION (JP) 2016-05-03 US disclosed
US-20160097978-A1 RESIST PATTERN-FORMING METHOD JSR CORPORATION (JP) 2016-04-07 US disclosed
US-9268229-B2 Composition for forming resist underlayer film, and pattern-forming method JSR CORPORATION (JP) 2016-02-23 US disclosed
US-9250526-B2 Composition for forming resist underlayer film, and pattern-forming method JSR CORPORATION (JP) 2016-02-02 US disclosed
US-20150355546-A1 COMPOSITION FOR SILICON-CONTAINING FILM FORMATION, PATTERN-FORMING METHOD, AND POLYSILOXANE COMPOUND JSR CORPORATION (JP) 2015-12-10 US disclosed
EP-2615497-A1 RESIST PATTERN FORMING METHOD JSR Corporation (JP) 2013-07-17 EP disclosed
US-20130130179-A1 POLYSILOXANE COMPOSITION AND PATTERN-FORMING METHOD JSR CORPORATION (JP) 2013-05-23 US disclosed
US-20130107235-A1 PATTERN-FORMING METHOD JSR CORPORATION (JP) 2013-05-02 US disclosed
WO-2013061601-A1 PATTERN-FORMING METHOD JSR CORPORATION (JP) 2013-05-02 WO disclosed
US-20130101942-A1 METHOD FOR FORMING RESIST PATTERN, AND COMPOSITION FOR FORMING RESIST UNDERLAYER FILM JSR CORPORATION (JP) 2013-04-25 US disclosed
EP-2579304-A1 INSULATION PATTERN FORMING METHOD AND INSULATION PATTERN FORMING MATERIAL FOR DAMASCENE PROCESS JSR Corporation (JP) 2013-04-10 EP disclosed
US-20130084394-A1 INSULATION PATTERN-FORMING METHOD AND INSULATION PATTERN-FORMING MATERIAL JSR CORPORATION (JP) 2013-04-04 US disclosed
US-20120183908-A1 RESIST PATTERN-FORMING METHOD JSR CORPORATION (JP) 2012-07-19 US disclosed
US-20100233632-A1 SILICON-CONTAINING FILM-FORMING COMPOSITION, SILICON-CONTAINING FILM, AND PATTERN FORMING METHOD JSR CORPORATION (JP) 2010-09-16 US disclosed
US-20100178620-A1 INVERTED PATTERN FORMING METHOD AND RESIN COMPOSITION JSR CORPORATION (JP) 2010-07-15 US disclosed