SCHEMBL4350592

SCHEMBL4350592

COc1ccc(/C(C#N)=N/OS(=O)(=O)c2cccc3ccccc23)cc1

nearest known ligand 0.42

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
▸ NPC1 O15118 4/20 0.42
▸ RAB9A P51151 4/20 0.42
▸ KMT2A Q03164 3/20 0.42
▸ F2 P00734 2/20 0.40
▸ PRSS1 P07477 2/20 0.40
▸ PRSS2 P07478 2/20 0.40
▸ PRSS3 P35030 2/20 0.40
▸ POLB P06746 1/20 0.38
▸ TUBB4A P04350 2/20 0.38
▸ TUBB P07437 2/20 0.38
▸ TUBA3C P0DPH7 2/20 0.38
▸ TUBA1B P68363 2/20 0.38
▸ TUBA4A P68366 2/20 0.38
▸ TUBB4B P68371 2/20 0.38
▸ TUBB3 Q13509 2/20 0.38
▸ TUBB2A Q13885 2/20 0.38
▸ TUBB8 Q3ZCM7 2/20 0.38
▸ TUBA3E Q6PEY2 2/20 0.38
▸ TUBA1A Q71U36 2/20 0.38
▸ TUBA1C Q9BQE3 2/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL4350596 1.00 NPC1 (0.42) NPC1RAB9AKMT2AF2PRSS1
SCHEMBL30529837 1.00 NPC1 (0.42) NPC1RAB9AKMT2AF2PRSS1
SCHEMBL29761878 0.88 F2 (0.40) F2PRSS1PRSS2PRSS3HSP90AA1
SCHEMBL5367442 0.88 F2 (0.40) F2PRSS1PRSS2PRSS3HSP90AA1
SCHEMBL6741146 0.88 F2 (0.40) F2PRSS1PRSS2PRSS3HSP90AA1
SCHEMBL6809982 0.85 POLB (0.38) NPC1RAB9AKMT2APOLBL3MBTL1
SCHEMBL36764 0.84 KMT2A (0.42) NPC1RAB9AKMT2AF2L3MBTL1
SCHEMBL36763 0.84 KMT2A (0.42) NPC1RAB9AKMT2AF2L3MBTL1
SCHEMBL29359430 0.84 KMT2A (0.42) NPC1RAB9AKMT2AF2L3MBTL1
SCHEMBL36510 0.81 HSD11B1 (0.46) NPC1RAB9AKMT2AL3MBTL1MAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 25 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6245930-B1 AN OXIMESULFONATE COMPOUND CAPABLE OF GIVING POSITIVELY OR NEGATIVELY PATTERNED RESIST LAYER OF EXCELLENT PATTERN RESOLUTION, CROSS SECTIOANL PROFILE, AND HIGH SENSITIVITY TOKYO OHKA KOGYO CO., LTD. (JP) 2001-06-12 — — US claimed
US-5976760-A Chemical-sensitization resist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1999-11-02 — — US claimed
CN-112987497-A Resist composition and resist pattern forming method 东京应化工业株式会社 2021-06-18 — — CN disclosed
US-20090207287-A1 Colored photosensitive composition, and color filter array and solid image pickup device using the same SONY CORPORATION (JP) 2009-08-20 — — US disclosed
US-20090207286-A1 Colored photosensitive composition, and color filter array and solid image pickup device using the same SONY CORPORATION (JP) 2009-08-20 — — US disclosed
US-20080237553-A1 Colored photosensitive resin composition, and color filter array and solid-state image pickup device using the same SUMITOMO CHEMICAL COMPANY, LIMITED 2008-10-02 — — US disclosed
US-20080237554-A1 Colored photosensitive resin composition, and color filter array and solid-state image pickup device using the same SUMITOMO CHEMICAL COMPANY LIMITED 2008-10-02 — — US disclosed
US-20070287086-A1 Colored photosensitive resin composition, color filter, image sensor, and camera system SONY CORPORATION (JP) 2007-12-13 — — US disclosed
US-20070287087-A1 Colored photosensitive resin composition, color filter, image sensor, and camera system SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-12-13 — — US disclosed
EP-1860502-A1 Colored photosensitive resin composition, color filter, image sensor, and camera system Sumitomo Chemical Company, Limited (JP) 2007-11-28 — — EP disclosed
EP-1860503-A2 Colored photosensitive resin composition, color filter, image sensor, and camera system Sumitomo Chemical Company, Limited (JP) 2007-11-28 — — EP disclosed
EP-0848289-B1 Negative-working chemical sensitization photoresist composition TOKYO OHKA KOGYO CO LTD (JP) 2002-02-27 — — EP disclosed
EP-0821274-B1 Chemical-sensitization resist composition TOKYO OHKA KOGYO CO LTD (JP) 2001-11-14 — — EP disclosed
US-6268108-B1 MIXTURE OF COMPOUND FORMING ACID UPON EXPOSURE OF ACTINIC RADIATION, COMPOUND CAPABLE OF CROSSLINKING, DYE AND SOLVENT TOKYO OHKA KOGYO CO., LTD. (JP) 2001-07-31 — — US disclosed
US-6245930-B1 AN OXIMESULFONATE COMPOUND CAPABLE OF GIVING POSITIVELY OR NEGATIVELY PATTERNED RESIST LAYER OF EXCELLENT PATTERN RESOLUTION, CROSS SECTIOANL PROFILE, AND HIGH SENSITIVITY TOKYO OHKA KOGYO CO., LTD. (JP) 2001-06-12 — — US disclosed
US-5976760-A Chemical-sensitization resist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1999-11-02 — — US disclosed
US-5928837-A Negative-working chemical-sensitization photoresist composition comprising oxime sulfonate compounds TOKYO OHKA KOGYO CO., LTD. (JP) 1999-07-27 — — US disclosed
US-5817444-A POLYHYDROXYSTYRENE SUBSTITUTED WITH TETRAHYDROPYRAN GROUPS, POLYHYDROXYSTYRENE SUBSTITUTED WITH ALKOXYALKYL GROUPS TOKYO OHKA KOGYO CO., LTD. (JP) 1998-10-06 — — US disclosed
EP-0848289-A1 Negative-working chemical sensitization photoresist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1998-06-17 — — EP disclosed
EP-0821274-A1 Chemical-sensitization resist composition TOKYO OHKA KOGYO CO., LTD. (JP) 1998-01-28 — — EP disclosed
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