SCHEMBL447454

SCHEMBL447454

CO[Si](CCc1ccccc1)(OC)OCCCNCCN

nearest known ligand 0.47

Predicted protein targets (top 9)

geneUniProtsupporting neighboursconfidence
DRD2 P14416 2/20 0.46
DRD4 P21917 2/20 0.46
DRD3 P35462 2/20 0.46
SIGMAR1 Q99720 7/20 0.44
MEN1 O00255 1/20 0.42
KMT2A Q03164 1/20 0.42
KDM4E B2RXH2 1/20 0.40
LMNA P02545 1/20 0.40
GAA P10253 1/20 0.40

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL28175344 0.96 SIGMAR1 (0.44) DRD2DRD4DRD3SIGMAR1
SCHEMBL37761 0.93 SIGMAR1 (0.42) DRD2DRD4DRD3SIGMAR1KDM4E
SCHEMBL1603369 0.89 SIGMAR1 (0.44) DRD2DRD4DRD3SIGMAR1MEN1
SCHEMBL37400 0.88 DRD2 (0.44) DRD2DRD4DRD3SIGMAR1GAA
SCHEMBL28789259 0.88 SIGMAR1 (0.39) DRD2DRD4DRD3SIGMAR1MEN1
Aniline SCHEMBL28077933 0.87 SIGMAR1 (0.38) DRD2DRD4DRD3SIGMAR1KDM4E
SCHEMBL3476726 0.87 MAOA (0.46)
Ethylene SCHEMBL28046221 0.87 SIGMAR1 (0.41) DRD2DRD4DRD3SIGMAR1MEN1
SCHEMBL17417253 0.86 SIGMAR1 (0.39) SIGMAR1KDM4ELMNA
SCHEMBL28073223 0.85 DRD2 (0.38) DRD2DRD4DRD3SIGMAR1MEN1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 80 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-4869964-A Oxidation resistant compositions for use with rare earth magnets THE B. F. GOODRICH COMPANY (US) 1989-09-26 US claimed
US-12261143-B2 Method of manufacturing substrate layered body and layered body MITSUI CHEMICALS, INC. (JP) 2025-03-25 US disclosed
CN-119654696-A Method for manufacturing substrate laminate and semiconductor device 三井化学株式会社 2025-03-18 CN disclosed
CN-119497906-A Method for producing substrate laminate and substrate laminate 三井化学株式会社 2025-02-21 CN disclosed
WO-2025005084-A1 SUBSTRATE LAMINATE 三井化学株式会社 2025-01-02 WO disclosed
CN-115956098-B Composition, laminate, and method for producing laminate 三井化学株式会社 2024-11-26 CN disclosed
WO-2024225232-A1 SEMICONDUCTOR STRUCTURE AND METHOD FOR PRODUCING SAME 三井化学株式会社 2024-10-31 WO disclosed
WO-2024177116-A1 PRODUCTION METHOD FOR SEMICONDUCTOR CHIP WITH RESIN LAYER AND PRODUCTION METHOD FOR SUBSTRATE LAMINATE 三井化学株式会社 2024-08-29 WO disclosed
WO-2024177149-A1 SEMICONDUCTOR STRUCTURE AND METHOD FOR PRODUCING SAME 三井化学株式会社 2024-08-29 WO disclosed
WO-2024177074-A1 METHOD FOR MANUFACTURING SUBSTRATE LAMINATE 三井化学株式会社 2024-08-29 WO disclosed
US-8901186-B2 Process for producing silica-comprising dispersions comprising polyetherols or polyether amines BASF SE (DE) 2014-12-02 US disclosed
EP-2614118-A1 SILICON DIOXIDE DISPERSIONS BASF SE (DE) 2013-07-17 EP disclosed
EP-2337806-B1 METHOD FOR PRODUCING POLYOL DISPERSIONS CONTAINING SILICA BASF SE (DE) 2013-03-27 EP disclosed
US-20120065341-A1 SILICON DIOXIDE DISPERSIONS BASF SE (DE) 2012-03-15 US disclosed
WO-2012032099-A1 SILICON DIOXIDE DISPERSIONS BASF SE (DE) 2012-03-15 WO disclosed
US-20110313070-A1 PROCESS FOR PRODUCING SILICA-COMPRISING DISPERSIONS COMPRISING POLYETHEROLS OR POLYETHER AMINES BASF SE (DE) 2011-12-22 US disclosed
US-20110266497-A1 PROCESS FOR PRODUCING SILICA-COMPRISING POLYOL DISPERSIONS AND THEIR USE FOR PRODUCING POLYURETHANE MATERIALS BASF SE (DE) 2011-11-03 US disclosed
US-20060004121-A1 Polymer-brush modified fillers for composites REGENTS OF THE UNIVERSITY OF COLORADO, THE 2006-01-05 US disclosed
WO-1992005433-A1 CONTINUOUS POSITIVE CHARGE CAPILLARY COLUMNS USED IN CAPILLARY ELECTROPHORESIS KERR ROBERT (FR) 1992-04-02 WO disclosed
US-4689422-A Novel ligand catalyst systems formed by reaction of carbonyl compounds with organosilicon compounds TEXACO INC. (US) 1987-08-25 US disclosed