SCHEMBL452980

SCHEMBL452980

Cc1ccc(S(=O)(=O)OS(c2ccccc2)(c2ccccc2)c2ccc(C(C)(C)C)cc2)cc1

nearest known ligand 0.48

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 4/20 0.48
BCHE P06276 2/20 0.48
ACHE P22303 2/20 0.48
HSD17B3 P37058 1/20 0.48
TSHR P16473 1/20 0.46
LMNA P02545 2/20 0.43
ALDH1A1 P00352 3/20 0.42
HTT P42858 2/20 0.42
SMN1; SMN2 Q16637 2/20 0.42
NPC1 O15118 1/20 0.41
RECQL P46063 1/20 0.41
RAB9A P51151 1/20 0.41
VDR P11473 1/20 0.41
CYP3A4 P08684 1/20 0.39
CYP2C19 P33261 1/20 0.39
HSD17B2 P37059 2/20 0.39
GAA P10253 1/20 0.39
MEN1 O00255 1/20 0.39
KMT2A Q03164 1/20 0.39
KEAP1 Q14145 1/20 0.38

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL3140903 1.00 HSD11B1 (0.48) HSD11B1BCHEACHEHSD17B3TSHR
SCHEMBL7028778 0.94 BCHE (0.53) HSD11B1BCHEACHEHSD17B3TSHR
SCHEMBL451539 0.94 HSD11B1 (0.53) HSD11B1HSD17B3LMNAALDH1A1NPC1
SCHEMBL2634260 0.94 HSD11B1 (0.53) HSD11B1HSD17B3LMNAALDH1A1NPC1
SCHEMBL5171841 0.92 ALDH1A1 (0.50) HSD11B1BCHEACHEHSD17B3LMNA
SCHEMBL2955938 0.89 VDR (0.49) BCHEACHELMNAALDH1A1HTT
SCHEMBL64190 0.89 VDR (0.49) BCHEACHELMNAALDH1A1HTT
SCHEMBL2962485 0.89 VDR (0.49) BCHEACHELMNAALDH1A1HTT
SCHEMBL2964106 0.89 VDR (0.49) BCHEACHELMNAALDH1A1HTT
SCHEMBL3144536 0.89 VDR (0.49) BCHEACHELMNAALDH1A1HTT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 121 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-104823110-B Photosensitive resin composition, photosensitive film, and method for forming resist pattern 昭和电工材料株式会社 2021-06-04 CN claimed
EP-4328963-B1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE RESONAC CORP (JP) 2025-08-27 EP disclosed
CN-118749078-A Photosensitive resin composition set, optical waveguide, method for producing optical waveguide, opto-electric hybrid board, sheet set, core resin composition, coating resin composition, and resin sheet 味之素株式会社 2024-10-08 CN disclosed
US-20240282684-A1 SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME RESONAC CORPORATION (JP) 2024-08-22 US disclosed
US-20240250025-A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE RESONAC CORPORATION (JP) 2024-07-25 US disclosed
US-11990396-B2 Substrate and method for manufacturing the same RESONAC CORPORATION (JP) 2024-05-21 US disclosed
EP-3010943-B1 CURABLE COMPOSITION, FILM, AND METHOD OF PRODUCING FILM CANON KK (JP) 2024-04-03 EP disclosed
EP-4328963-A1 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE Resonac Corporation (JP) 2024-02-28 EP disclosed
CN-117296144-A Method for manufacturing semiconductor device and semiconductor device 株式会社力森诺科 2023-12-26 CN disclosed
WO-2023145537-A1 PHOTOSENSITIVE RESIN COMPOSITION SET, OPTICAL WAVEGUIDE AND METHOD FOR PRODUCING SAME, PHOTOELECTRIC HYBRID BOARD, SHEET SET, RESIN COMPOSITION FOR CORES, RESIN COMPOSITION FOR CLADDINGS, AND RESIN SHEET 味の素株式会社 2023-08-03 WO disclosed
US-20030022095-A1 Negative type radiation sensitive resin composition JSR CORPORATION (JP) 2003-01-30 US disclosed
US-20020196896-A1 Exposure method, exposure apparatus, X-ray mask, semiconductor device and microstructure MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2002-12-26 US disclosed
US-20020090569-A1 Radiation-sensitive resin composition JSR CORPORATION (JP) 2002-07-11 US disclosed
EP-1193553-A2 Exposure method, exposure apparatus, x-ray mask, semiconductor device and microstructure MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2002-04-03 EP disclosed
US-20010038971-A1 Chemical amplification, positive resist compositions SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-11-08 US disclosed
US-20010033994-A1 Chemical amplification, positive resist compositions SHIN-ETSU CHEMICAL CO., LTD. (JP) 2001-10-25 US disclosed
US-6280902-B1 RESIN CONVERTED TO ALKALI SOLUBLE TO ALKALI INSOLUBLE OR ALKALI SLIGHTLY ACID SOLUBLE, AN ACID GENERATOR AND NITROGEN CYCLIC COMPOUND SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2001-08-28 US disclosed
EP-1058153-A1 Positive working photoresist compositions SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2000-12-06 EP disclosed
US-6143460-A PHOTOACID GENERATOR PROVIDING IMPROVED PHOTORESIST RESOLUTION JSR CORPORATION (JP) 2000-11-07 US disclosed
EP-0959389-A1 Diazodisulfone compound and radiation-sensitive resin composition JSR Corporation (JP) 1999-11-24 EP disclosed