SCHEMBL476499

SCHEMBL476499

C[CH]CC1C2CC3CC(C2)CC1C3

nearest known ligand 0.39

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 1/20 0.39
CYP2C9 P11712 1/20 0.33
CXCR3 P49682 2/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL22462244 0.74 HSD11B1 (0.50) HSD11B1CYP2C9CXCR3
SCHEMBL150989 0.74 HSD11B1 (0.39) HSD11B1CYP2C9
SCHEMBL159996 0.74 HSD11B1 (0.50) HSD11B1CYP2C9CXCR3
SCHEMBL6262984 0.72 HSD11B1 (0.38) HSD11B1CYP2C9
SCHEMBL678974 0.69 HSD11B1 (0.50) HSD11B1CYP2C9CXCR3
SCHEMBL39664 0.69 HSD11B1 (0.44) HSD11B1CYP2C9CXCR3
SCHEMBL16567928 0.69 HSD11B1 (0.50) HSD11B1CYP2C9CXCR3
SCHEMBL21048748 0.69 HSD11B1 (0.50) HSD11B1CYP2C9CXCR3
SCHEMBL8669289 0.69 HSD11B1 (0.35) HSD11B1
SCHEMBL6657914 0.67 HSD11B1 (0.42) HSD11B1CYP2C9CXCR3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 189 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
CN-117945957-A Photoacid generating compounds and related polymers, photoresist compositions, and methods of forming photoresist relief images 罗门哈斯电子材料有限责任公司 2024-04-30 CN disclosed
US-11204552-B2 Radiation-sensitive composition, pattern-forming method and radiation-sensitive acid generating agent JSR CORPORATION (JP) 2021-12-21 US disclosed
CN-106187964-B Acid generator compound and photoresist comprising the same 罗门哈斯电子材料有限责任公司 2021-04-06 CN disclosed
US-20200041902-A9 RADIATION-SENSITIVE COMPOSITION, PATTERN-FORMING METHOD AND RADIATION-SENSITIVE ACID GENERATING AGENT JSR CORPORATION (JP) 2020-02-06 US disclosed
US-10088750-B2 Acid diffusion control agent, radiation-sensitive resin composition, resist pattern-forming method, compound, and production method JSR CORPORATION (JP) 2018-10-02 US disclosed
US-20180267406-A1 RADIATION-SENSITIVE COMPOSITION, PATTERN-FORMING METHOD AND RADIATION-SENSITIVE ACID GENERATING AGENT JSR CORPORATION (JP) 2018-09-20 US disclosed
US-9874816-B2 Radiation-sensitive resin composition and resist pattern-forming method JSR CORPORATION (JP) 2018-01-23 US disclosed
US-20170363961-A9 RADIATION-SENSITIVE RESIN COMPOSITION AND RESIST PATTERN-FORMING METHOD JSR CORPORATION (JP) 2017-12-21 US disclosed
US-20170131632-A1 ACID DIFFUSION CONTROL AGENT, RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN-FORMING METHOD, COMPOUND, AND PRODUCTION METHOD JSR CORPORATION (JP) 2017-05-11 US disclosed
US-9588423-B2 Acid diffusion control agent, radiation-sensitive resin composition, resist pattern-forming method, compound, and production method JSR CORPORATION (JP) 2017-03-07 US disclosed
EP-1347335-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2003-09-24 EP disclosed
EP-1341038-A2 Photosensitive resin composition FUJI PHOTO FILM CO., LTD. (JP) 2003-09-03 EP disclosed
US-20030134224-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2003-07-17 US disclosed
US-20030134225-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2003-07-17 US disclosed
EP-1319981-A2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2003-06-18 EP disclosed
EP-1296190-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2003-03-26 EP disclosed
EP-1273969-A2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2003-01-08 EP disclosed
US-20020168584-A1 Photopolymerization using acid generator FUJI PHOTO FILM CO., LTD. 2002-11-14 US disclosed
EP-1243968-A2 Positive resist composition FUJI PHOTO FILM CO., LTD. (JP) 2002-09-25 EP disclosed
US-20020061464-A1 Positive resist composition FUJI PHOTO FILM CO., LTD. 2002-05-23 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20170131632-A1 ACID DIFFUSION CONTROL AGENT, RADIATION-SENSITIVE RESIN COMPOSITION, RESIST PATTERN-FORMING METHOD, COMPOUND, AND PRODUCTION METHOD RER1, RFC4, RFC2 HSD11B1 2435/4885CYP2C9 2789/4885CXCR3 3227/4885
US-11204552-B2 Radiation-sensitive composition, pattern-forming method and radiation-sensitive acid generating agent NOS1, ADCY1, IFNAR1 HSD11B1 1737/4885CYP2C9 2888/4885CXCR3 1179/4885
US-10088750-B2 Acid diffusion control agent, radiation-sensitive resin composition, resist pattern-forming method, compound, and production method RER1, RFC4, RFC2 HSD11B1 2435/4885CYP2C9 2789/4885CXCR3 3227/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.