SCHEMBL503875

SCHEMBL503875

CCCCCCCCCCS(=O)(=O)OC(CO)(C(=O)c1ccccc1)c1ccccc1

nearest known ligand 0.42

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
CES1 P23141 4/20 0.42
CES2 O00748 3/20 0.42
NAAA Q02083 1/20 0.38
MMP1 P03956 1/20 0.38
MMP9 P14780 1/20 0.38
MMP13 P45452 1/20 0.38
KCNH2 Q12809 1/20 0.38
PTGS2 P35354 1/20 0.35
PRSS1 P07477 1/20 0.35
CTSG P08311 1/20 0.35
CTRB1 P17538 1/20 0.35
CMA1 P23946 1/20 0.35
PTPN1 P18031 1/20 0.35

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL503385 1.00 CES1 (0.42) CES1CES2NAAAMMP1MMP9
SCHEMBL2903853 1.00 CES1 (0.42) CES1CES2NAAAMMP1MMP9
SCHEMBL5707358 0.80 PPARA (0.37) CES1CES2
SCHEMBL5913016 0.79 CES1 (0.45) CES1CES2PTPN1
SCHEMBL11579454 0.77 CES1 (0.42) CES1CES2PTPN1
SCHEMBL1255415 0.77 LMNA (0.50) CES1CES2KCNH2
SCHEMBL9575220 0.77 CES1 (0.40) CES1CES2NAAAMMP1MMP9
SCHEMBL455255 0.76 CES1 (0.44) CES1CES2PTPN1
SCHEMBL2903855 0.75 NAAA (0.43) CES1CES2NAAAMMP1MMP9
SCHEMBL503876 0.75 NAAA (0.43) CES1CES2NAAAMMP1MMP9

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8435718-B2 Upper layer-forming composition and photoresist patterning method JSR CORPORATION (JP) 2013-05-07 US disclosed
EP-1950610-B1 IMMERSION LITHOGRAPHIC COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR CORP (JP) 2012-05-02 EP disclosed
US-20120028198-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2012-02-02 US disclosed
US-20100003615-A1 UPPER LAYER-FORMING COMPOSITION AND PHOTORESIST PATTERNING METHOD JSR CORPORATION (JP) 2010-01-07 US disclosed
EP-1950610-A1 COMPOSITION FOR FORMING UPPER FILM AND METHOD FOR FORMING PHOTORESIST PATTERN JSR Corporation (JP) 2008-07-30 EP disclosed