SCHEMBL683431

SCHEMBL683431

COC(C)OCCOc1ccc(Oc2ccccc2)cc1

nearest known ligand 0.56

Predicted protein targets (top 10)

geneUniProtsupporting neighboursconfidence
LTA4H P09960 7/20 0.56
PLA2G2A P14555 1/20 0.51
PPARA Q07869 3/20 0.49
PPARG P37231 2/20 0.49
PPARD Q03181 2/20 0.49
HRH3 Q9Y5N1 1/20 0.45
MAPT P10636 1/20 0.45
RAB9A P51151 1/20 0.45
SLC2A1 P11166 1/20 0.45
KCNA3 P22001 1/20 0.44

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL775134 0.93 KCNA3 (0.50) LTA4HMAPTRAB9AKCNA3
SCHEMBL14094038 0.85 LTA4H (0.54) LTA4HPLA2G2APPARAPPARGPPARD
SCHEMBL11692748 0.84 LTA4H (0.61) LTA4HPLA2G2APPARAPPARGPPARD
SCHEMBL683157 0.84 RAB9A (0.50) LTA4HMAPTRAB9A
SCHEMBL683156 0.84 NPSR1 (0.44) LTA4HPPARAPPARGPPARDMAPT
SCHEMBL683148 0.83 NAAA (0.48) LTA4HPPARAPPARGPPARDSLC2A1
SCHEMBL19497635 0.82 CYP2C9 (0.44) MAPTRAB9A
SCHEMBL28366804 0.81 LMNA (0.48) LTA4HMAPTRAB9AKCNA3
SCHEMBL11696533 0.80 LTA4H (0.61) LTA4HPLA2G2APPARAPPARGPPARD
SCHEMBL8671305 0.80 LTA4H (0.75) LTA4HPLA2G2APPARAHRH3KCNA3

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 5 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-9090722-B2 Chemical amplification resist composition, and mold preparation method and resist film using the same FUJIFILM CORPORATION (JP) 2015-07-28 US disclosed
US-9090722-B2 Chemical amplification resist composition, and mold preparation method and resist film using the same FUJIFILM CORPORATION (JP) 2015-07-28 US disclosed
US-20120006788-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-12 US disclosed
US-20120006788-A1 CHEMICAL AMPLIFICATION RESIST COMPOSITION, AND MOLD PREPARATION METHOD AND RESIST FILM USING THE SAME FUJIFILM CORPORATION (JP) 2012-01-12 US disclosed
US-20080206668-A1 NEGATIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-08-28 US disclosed