SCHEMBL775134

SCHEMBL775134

COC(C)OCCOc1ccccc1

nearest known ligand 0.50

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
KCNA3 P22001 1/20 0.50
MAPT P10636 1/20 0.46
RAB9A P51151 1/20 0.46
PKM P14618 2/20 0.46
HTR1B P28222 2/20 0.46
LMNA P02545 1/20 0.46
HTR1D P28221 1/20 0.46
TAAR1 Q96RJ0 1/20 0.45
ALDH1A1 P00352 1/20 0.45
RECQL P46063 1/20 0.45
LTA4H P09960 2/20 0.44
SIGMAR1 Q99720 1/20 0.44
CHRNB2 P17787 2/20 0.43
CHRNB4 P30926 2/20 0.43
CHRNA3 P32297 2/20 0.43
CHRNA7 P36544 2/20 0.43
CHRNA4 P43681 2/20 0.43
DRD2 P14416 1/20 0.42
DRD4 P21917 1/20 0.42
DRD3 P35462 1/20 0.42

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL683431 0.93 LTA4H (0.56) KCNA3MAPTRAB9ALTA4H
SCHEMBL28366804 0.87 LMNA (0.48) KCNA3MAPTRAB9APKMHTR1B
SCHEMBL683157 0.87 RAB9A (0.50) MAPTRAB9ALMNALTA4HCHRNB2
SCHEMBL19497635 0.85 CYP2C9 (0.44) MAPTRAB9AALDH1A1DRD2DRD4
SCHEMBL683156 0.83 NPSR1 (0.44) MAPTLMNAALDH1A1RECQLLTA4H
SCHEMBL11220223 0.83 KCNA3 (0.48) KCNA3MAPTRAB9APKMHTR1B
SCHEMBL14094029 0.83 KCNA3 (0.48) KCNA3MAPTRAB9APKMHTR1B
SCHEMBL6564405 0.82 KCNA3 (0.56) KCNA3MAPTRAB9APKMHTR1B
SCHEMBL11135363 0.81 ALDH1A1 (0.62) KCNA3MAPTRAB9APKMHTR1B
SCHEMBL13717070 0.80 KDM4E (0.36) KCNA3MAPTLMNAALDH1A1CHRNB4

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 83 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-06-27 US disclosed
US-20230305392-A1 SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-09-28 US disclosed
US-20230305391-A1 SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-09-28 US disclosed
US-11739056-B2 Carboxylate, carboxylic acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-08-29 US disclosed
US-20230266666-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-08-24 US disclosed
US-11681224-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-06-20 US disclosed
US-11640114-B2 Compound, resin, photoresist composition and process for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-05-02 US disclosed
US-20180065924-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-03-08 US disclosed
US-20170305848-A1 SULFONIUM SALT, PHOTOACID GENERATOR, AND PHOTOSENSITIVE COMPOSITION TOKYO OHKA KOGYO CO., LTD. (JP) 2017-10-26 US disclosed
US-20170305848-A1 SULFONIUM SALT, PHOTOACID GENERATOR, AND PHOTOSENSITIVE COMPOSITION TOKYO OHKA KOGYO CO., LTD. (JP) 2017-10-26 US disclosed
US-7476488-B2 Photosensitive composition and method for forming pattern using same KABUSHIKI KAISHA TOSHIBA (JP) 2009-01-13 US disclosed
US-20080096130-A1 POSITIVE RESIST COMPOSITION FUJIFILM CORPORATION 2008-04-24 US disclosed
US-20080096130-A1 POSITIVE RESIST COMPOSITION FUJIFILM CORPORATION 2008-04-24 US disclosed
US-7338755-B2 Photosensitive composition and method for forming pattern using same KABUSHIKI KAISHA TOSHIBA (JP) 2008-03-04 US disclosed
US-20070238050-A1 PHOTOSENSITIVE COMPOSITION AND METHOD FOR FORMING PATTERN USING SAME KABUSHIKI KAISHA TOSHIBA (JP) 2007-10-11 US disclosed
US-20070238050-A1 PHOTOSENSITIVE COMPOSITION AND METHOD FOR FORMING PATTERN USING SAME KABUSHIKI KAISHA TOSHIBA (JP) 2007-10-11 US disclosed
US-20070224550-A1 PHOTOSENSITIVE COMPOSITION AND METHOD FOR FORMING PATTERN USING SAME KABUSHIKI KAISHA TOSHIBA (JP) 2007-09-27 US disclosed
US-20070224549-A1 PHOTOSENSITIVE COMPOSITION AND METHOD FOR FORMING PATTERN USING SAME KABUSHIKI KAISHA TOSHIBA (JP) 2007-09-27 US disclosed
US-7241554-B2 Photosensitive composition and method for forming pattern using same KABUSHIKI KAISHA TOSHIBA (JP) 2007-07-10 US disclosed
US-7241554-B2 Photosensitive composition and method for forming pattern using same KABUSHIKI KAISHA TOSHIBA (JP) 2007-07-10 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (7 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20170305848-A1 SULFONIUM SALT, PHOTOACID GENERATOR, AND PHOTOSENSITIVE COMPOSITION ARSA, SPIN1, ASIC1 KCNA3 336/4885MAPT 4089/4885RAB9A 323/4885
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SCO2, CBR1, OXGR1 KCNA3 1116/4885MAPT 4657/4885RAB9A 3601/4885
US-20230305391-A1 SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN RER1, H1-0, BET1 KCNA3 2292/4885MAPT 3864/4885RAB9A 1721/4885
US-11739056-B2 Carboxylate, carboxylic acid generator, resist composition and method for producing resist pattern CHRM1, CHRM2, SCO2 KCNA3 1425/4885MAPT 4650/4885RAB9A 2494/4885
US-11640114-B2 Compound, resin, photoresist composition and process for producing photoresist pattern HAX1, BRIX1, RXRA KCNA3 3829/4885MAPT 1336/4885RAB9A 2566/4885
US-20230266666-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-0, H1-4, CHRM1 KCNA3 300/4885MAPT 4603/4885RAB9A 1633/4885
US-20180065924-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME C1R, RER1, C1S KCNA3 290/4885MAPT 3407/4885RAB9A 2745/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.