SCHEMBL818753

SCHEMBL818753

CS(=O)(=O)c1cccc2c1C=CC(=[N+]=[N-])C2=O

nearest known ligand 0.31

Predicted protein targets (top 7)

geneUniProtsupporting neighboursconfidence
BRD9 Q9H8M2 1/20 0.31
BAZ2B Q9UIF8 1/20 0.31
BAZ2A Q9UIF9 1/20 0.31
PTPRC P08575 1/20 0.31
ALDH1A1 P00352 1/20 0.30
SMN1; SMN2 Q16637 1/20 0.30
HSD11B1 P28845 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7645795 0.86
SCHEMBL25780834 0.85 ADRA2A (0.31) PTPRC
SCHEMBL15624676 0.85 ALOX15 (0.31) PTPRC
SCHEMBL823909 0.84
SCHEMBL823887 0.84 TTR (0.33) PTPRC
SCHEMBL9644548 0.84 STAT3 (0.41)
SCHEMBL8608275 0.84 TTR (0.33) PTPRC
SCHEMBL823904 0.84 PTPRC (0.35) PTPRC
Hydrochloric Acid SCHEMBL7749007 0.83 TTR (0.33) PTPRC
SCHEMBL7103287 0.83 PKLR (0.36)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 226 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240210827-A1 PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR MANUFACTURING CURED RELIEF PATTERN, AND SEMICONDUCTOR APPARATUS ASAHI KASEI KABUSHIKI KAISHA (JP) 2024-06-27 US disclosed
US-11822242-B2 DNQ-type photoresist composition including alkali-soluble acrylic resins MERCK PATENT GMBH (DE) 2023-11-21 US disclosed
US-20230369271-A1 DISPLAY DEVICE AND METHOD FOR MANUFACTURING DISPLAY DEVICE TORAY INDUSTRIES, INC. (JP) 2023-11-16 US disclosed
US-11802181-B2 Di-amine compound, and heat-resistant resin and resin composition using the same TORAY INDUSTRIES, INC. (JP) 2023-10-31 US disclosed
US-20230335697-A1 DISPLAY DEVICE AND PRODUCTION METHOD FOR DISPLAY DEVICE TORAY INDUSTRIES, INC. (JP) 2023-10-19 US disclosed
US-20230314942-A1 POLYCYCLIC POLYPHENOLIC RESIN, COMPOSITION, METHOD FOR PRODUCING POLYCYCLIC POLYPHENOLIC RESIN, COMPOSITION FOR FILM FORMATION, RESIST COMPOSITION, RESIST PATTERN FORMATION METHOD, RADIATION-SENSITIVE COMPOSITION, COMPOSITION FOR UNDERLAYER FILM FORMATION FOR LITHOGRAPHY, METHOD FOR PRODUCING UNDERLAYER FILM FOR LITHOGRAPHY, CIRCUIT PATTERN FORMATION METHOD, AND COMPOSITION FOR OPTICAL MEMBER FORMATION MITSUBISHI GAS CHEMICAL COMPANY, INC. (JP) 2023-10-05 US disclosed
US-11768434-B2 Polymer having a structure of polyamide, polyamide-imide, or polyimide, photosensitive resin composition, patterning process, photosensitive dry film, and protective film for electric and electronic parts SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-09-26 US disclosed
US-11762290-B2 Photoresist composition, method for preparing the same, and patterning method Beijing Asahi Electronic Materials Co., Ltd (CN) 2023-09-19 US disclosed
US-11675266-B2 Photosensitive compound, photosensitive composition, and patterning method INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (TW) 2023-06-13 US disclosed
US-11650499-B2 Photosensitive resin composition, organic EL element barrier rib, and organic EL element SHOWA DENKO K.K. (JP) 2023-05-16 US disclosed
US-20070254221-A1 Akali-soluble resin, quinone diazide, surfactant mixture of a 3-perfluoroalkylpropane epoxide and polyethersilicones), and a solvent; high-quality display panels with uniformly-coated insulating layers. SAMSUNG DISPLAY CO., LTD. (KR) 2007-11-01 US disclosed
US-20070218398-A1 Photosensitive silane coupling agent, method of modifying surface, method of forming pattern, and method of fabricating device CANON KABUSHIKI KAISHA (JP) 2007-09-20 US disclosed
US-7256419-B2 Composition for forming organic insulating film and organic insulating film formed from the same SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-08-14 US disclosed
US-7238455-B2 Mixture of alkali soluble resin, quinonediazide compound and alcohol SUMITOMO BAKELITE COMPANY, LTD. (JP) 2007-07-03 US disclosed
US-7229747-B2 Surface treatment of interpenetrating polymer networkcarbon tubes; photolithography; heat curing; negative patterns SAMSUNG ELECTRONICS CO., LTD. (KR) 2007-06-12 US disclosed
US-20070122733-A1 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2007-05-31 US disclosed
US-7220520-B2 Photosensitive resin compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. (US) 2007-05-22 US disclosed
US-7214455-B2 Photosensitive resin composition and process for producing heat-resistant resin film TORAY INDUSTRIES, INC. (JP) 2007-05-08 US disclosed
US-20070099111-A1 Novel positive photosensitive polybenzoxazole precursor compositions FUJIFILM ELECTRONIC MATERIALS U.S.A., INC. 2007-05-03 US disclosed
US-7195849-B2 Photosensitive resin compositions ARCH SPECIALTY CHEMICALS, INC. (US) 2007-03-27 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (2 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11675266-B2 Photosensitive compound, photosensitive composition, and patterning method LCP1, RARG, DSG1 BRD9 60/4885BAZ2B 1527/4885BAZ2A 1205/4885
US-11802181-B2 Di-amine compound, and heat-resistant resin and resin composition using the same CAD, ARID2, SMC3 BRD9 264/4885BAZ2B 292/4885BAZ2A 307/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.