SCHEMBL10178704

SCHEMBL10178704

CCC(C)c1ccc(CC(=O)n2c3ccccc3c(=O)c3ccccc32)cc1

nearest known ligand 0.54

Predicted protein targets (top 14)

geneUniProtsupporting neighboursconfidence
▸ PTGS2 P35354 3/20 0.54
▸ P2RX4 Q99571 5/20 0.50
▸ ALDH1A1 P00352 2/20 0.41
▸ NTRK1 P04629 1/20 0.39
▸ RXFP1 Q9HBX9 1/20 0.39
▸ GLA P06280 1/20 0.38
▸ KDM4E B2RXH2 2/20 0.38
▸ CASP3 P42574 1/20 0.36
▸ CASP7 P55210 1/20 0.36
▸ HTR7 P34969 1/20 0.36
▸ NPC1 O15118 1/20 0.36
▸ RAB9A P51151 1/20 0.36
▸ POLB P06746 1/20 0.36
▸ TSHR P16473 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL10180072 0.93 PTGS2 (0.45) PTGS2P2RX4ALDH1A1KDM4EHTR7
SCHEMBL10180106 0.88 PTGS2 (0.52) PTGS2P2RX4ALDH1A1NTRK1RXFP1
SCHEMBL13144175 0.82 P2RX4 (0.61) PTGS2P2RX4ALDH1A1NTRK1
SCHEMBL10178700 0.81 HTR7 (0.45) PTGS2ALDH1A1HTR7NPC1RAB9A
SCHEMBL10178546 0.80 HDAC4 (0.43) PTGS2P2RX4ALDH1A1KDM4ECASP3
SCHEMBL6722016 0.79 P2RX4 (0.64) PTGS2P2RX4ALDH1A1NTRK1RXFP1
SCHEMBL10178524 0.75 ABCB1 (0.40) ALDH1A1KDM4ECASP3CASP7NPC1
SCHEMBL13144176 0.74 LMNA (0.60) PTGS2P2RX4ALDH1A1POLB
SCHEMBL12732178 0.72 HTR7 (0.52) KDM4ECASP3CASP7HTR7POLB
SCHEMBL10001830 0.71 TSHR (0.49) ALDH1A1KDM4ENPC1RAB9APOLB

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-8124310-B2 Positive resist composition and pattern forming method using the same FUJIFILM CORPORATION (JP) 2012-02-28 — — US disclosed
US-20090087784-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2009-04-02 — — US disclosed
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