SCHEMBL1077901

SCHEMBL1077901

C=CCC1(OC(=O)C=C)C2CC3CC(C2)CC1C3

nearest known ligand 0.30

Predicted protein targets (top 1)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1350530 0.89
SCHEMBL3257832 0.85 ALDH1A1 (0.32)
SCHEMBL43549 0.85 TSHR (0.34) HSD11B1
SCHEMBL14877443 0.85 HSD11B1 (0.31) HSD11B1
SCHEMBL1325437 0.82
SCHEMBL14580050 0.81 HSD11B1 (0.31) HSD11B1
SCHEMBL719297 0.81
SCHEMBL215042 0.81 THRB (0.36) HSD11B1
SCHEMBL5366670 0.80 HSD11B1 (0.37) HSD11B1
SCHEMBL4406082 0.80 TSHR (0.39)

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 108 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7862980-B2 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-01-04 US claimed
US-7803513-B2 Lithography; semiconductor microfabrication SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-09-28 US claimed
US-7759045-B2 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-07-20 US claimed
US-7741007-B2 Lithography; semiconductor microfabrication SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-06-22 US claimed
US-7611822-B2 Positive resist composition used for semiconductor microfabrication employing a lithography process contains an acid generator comprising a compound generating an acid by irradiation and a monomer having a bulky and acid-labile group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-11-03 US claimed
US-7579132-B2 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-08-25 US claimed
US-7494763-B2 Polyhydric phenol compound and chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-02-24 US claimed
US-20090042128-A1 Positive resist composition used for semiconductor microfabrication employing a lithography process contains an acid generator comprising a compound generating an acid by irradiation and a monomer having a bulky and acid-labile group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-02-12 US claimed
US-20090004601-A1 Chemically amplified positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-01-01 US claimed
US-20080248423-A1 Lithography; semiconductor microfabrication SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-10-09 US claimed
US-20080248417-A1 Polyhydric phenol compound and chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-10-09 US claimed
US-20080220369-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-09-11 US claimed
US-20080213695-A1 Lithography; semiconductor microfabrication SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-09-04 US claimed
US-20080176168-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-07-24 US claimed
US-20080044738-A1 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-02-21 US claimed
EP-1125917-A1 Alkyladamantyl esters and their preparation Chem Search Corporation (KR) 2001-08-22 EP claimed
US-6222061-B1 FOR PREPARING FLAME RETARDANTS CHEM SEARCH CORP. (KR) 2001-04-24 US claimed
US-9221785-B2 Salt and photoresist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2015-12-29 US disclosed
EP-1020767-A1 Chemical amplification type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2000-07-19 EP disclosed
EP-0982628-A2 A chemical amplifying type positive resist composition SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2000-03-01 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20090042128-A1 Positive resist composition used for semiconductor microfabrication employing a lithography process contains an acid generator comprising a compound generating an acid by irradiation and a monomer having a bulky and acid-labile group FRG1, ACSL3, HCN3 HSD11B1 1603/4885
US-20080044738-A1 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same NHERF1, SLC26A3, HCN3 HSD11B1 866/4885
US-20080248417-A1 Polyhydric phenol compound and chemically amplified resist composition containing the same CCNA1, C1R, CCNA2 HSD11B1 1270/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.