SCHEMBL18671963

SCHEMBL18671963

CCC(C)(I)C(=O)OCc1cccc2c(C)cccc12

nearest known ligand 0.43

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
▸ KDM4E B2RXH2 4/20 0.43
▸ ALDH1A1 P00352 4/20 0.43
▸ GLA P06280 2/20 0.43
▸ HSD17B10 Q99714 2/20 0.36
▸ HPGD P15428 1/20 0.36
▸ NPSR1 Q6W5P4 1/20 0.36
▸ CYP1A2 P05177 1/20 0.35
▸ CYP2A6 P11509 1/20 0.35
▸ CASP1 P29466 1/20 0.35
▸ GAA P10253 2/20 0.35
▸ LMNA P02545 1/20 0.34
▸ L3MBTL1 Q9Y468 2/20 0.34
▸ NLRP3 Q96P20 1/20 0.33
▸ MAOB P27338 1/20 0.33
▸ SMN1; SMN2 Q16637 2/20 0.33
▸ TSHR P16473 1/20 0.33
▸ MAPT P10636 1/20 0.33
▸ POLB P06746 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL18671832 0.86 CDC25B (0.37) KDM4EALDH1A1GLAGAA
SCHEMBL12419176 0.86 ALDH1A1 (0.41) KDM4EALDH1A1GLAHSD17B10HPGD
SCHEMBL18671962 0.85 MMP1 (0.38) KDM4EALDH1A1GLAHPGDCYP1A2
SCHEMBL18671843 0.85 EPHX1 (0.45) KDM4EALDH1A1GLAHPGDL3MBTL1
SCHEMBL18671830 0.81 IDO1 (0.35) KDM4EALDH1A1GLANPSR1GAA
SCHEMBL19222211 0.76 ESR1 (0.35) KDM4EALDH1A1GLAHSD17B10NPSR1
SCHEMBL20215425 0.74 TYR (0.36) KDM4E
SCHEMBL15189314 0.72 CDC25B (0.39) KDM4EALDH1A1GLAHSD17B10NPSR1
SCHEMBL8738362 0.72 CDC25B (0.39) ALDH1A1GAA
SCHEMBL18671841 0.72 ALDH1A1 (0.53) KDM4EALDH1A1HPGDLMNAL3MBTL1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20220404701-A1 CHEMICALLY AMPLIFIED RESIST COMPOSITION, PHOTOMASK BLANK, METHOD FOR FORMING RESIST PATTERN, AND METHOD FOR PRODUCING POLYMER COMPOUND SHIN-ETSU CHEMICAL CO., LTD. (JP) 2022-12-22 — — US disclosed
US-9604921-B2 Sulfonium salt, resist composition and resist pattern forming process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2017-03-28 — — US disclosed
Send feedback