SCHEMBL6932659

SCHEMBL6932659

COc1cccc(C(=[N+]=[N-])S(=O)(=O)c2ccccc2)c1

nearest known ligand 0.54

Predicted protein targets (top 18)

geneUniProtsupporting neighboursconfidence
HSD11B1 P28845 1/20 0.54
KAT6A Q92794 3/20 0.52
NPC1 O15118 3/20 0.48
RAB9A P51151 3/20 0.48
CES2 O00748 1/20 0.47
CES1 P23141 1/20 0.47
MAOB P27338 1/20 0.47
SMN1; SMN2 Q16637 1/20 0.46
PARP1 P09874 1/20 0.45
STS P08842 2/20 0.45
PGR P06401 2/20 0.44
KCNK3 O14649 1/20 0.44
KCNK9 Q9NPC2 1/20 0.44
BCHE P06276 1/20 0.44
MEN1 O00255 2/20 0.43
KMT2A Q03164 2/20 0.43
ABCG2 Q9UNQ0 1/20 0.43
NLRP3 Q96P20 1/20 0.43

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL6931275 0.84 HSD11B1 (0.51) HSD11B1NPC1RAB9ACES2CES1
SCHEMBL9010756 0.83 HSD11B1 (0.57) HSD11B1KAT6ANPC1RAB9ACES2
SCHEMBL6933539 0.81 KAT6A (0.49) KAT6ASMN1; SMN2PARP1KCNK3KCNK9
SCHEMBL3177012 0.80 PGR (0.47) HSD11B1KAT6APGR
SCHEMBL30457795 0.80 PGR (0.47) HSD11B1KAT6APGR
SCHEMBL28587398 0.75 HSD11B1 (0.54) HSD11B1KAT6ANPC1RAB9ACES2
SCHEMBL28587401 0.75 HSD11B1 (0.54) HSD11B1KAT6ANPC1RAB9ACES2
SCHEMBL3177826 0.75 MEP1B (0.46) HSD11B1KAT6ACES2CES1PGR
SCHEMBL10467675 0.74 CES2 (0.53) HSD11B1NPC1RAB9ACES2CES1
SCHEMBL6932650 0.73 LMNA (0.48) HSD11B1NPC1RAB9ACES2CES1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 7 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-6589705-B1 Positive-working photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 2003-07-08 US disclosed
US-6555289-B2 Positive photoresist composition comprises a resin having a specific silicon-containing group on the side chain, the solubility of which resin in an akali developer increases under action of an acid FUJI PHOTO FILM CO., LTD. (JP) 2003-04-29 US disclosed
US-6528229-B2 Mixture of polymer and acid generators FUJI PHOTO FILM CO., LTD. (JP) 2003-03-04 US disclosed
US-6506535-B1 A positive working photoresist composition for use in the production of semiconductor integrated circuit devices, mask for the production of integrated circuits, printed wiring boards, liquid crystal panels FUJI PHOTO FILM CO., LTD. (JP) 2003-01-14 US disclosed
US-20020048720-A1 Positive photoresist composition FUJIFILM CORPORATION (JP) 2002-04-25 US disclosed
US-20010041303-A1 Positive photoresist composition FUJIFILM CORPORATION (JP) 2001-11-15 US disclosed
EP-1096319-A1 Positive-working photoresist composition FUJI PHOTO FILM CO., LTD. (JP) 2001-05-02 EP disclosed