SCHEMBL20109662

SCHEMBL20109662

COCN1CC(OCc2ccc(C(CC(C)C)C(C)C)cc2)CN(COC)C1=O

nearest known ligand 0.34

Predicted protein targets (top 13)

geneUniProtsupporting neighboursconfidence
POLB P06746 1/20 0.34
NAAA Q02083 9/20 0.33
CARM1 Q86X55 1/20 0.32
PRMT6 Q96LA8 1/20 0.32
NFE2L2 Q16236 1/20 0.32
MEN1 O00255 1/20 0.31
KMT2A Q03164 1/20 0.31
CTSL P07711 1/20 0.30
CTSB P07858 1/20 0.30
CTSK P43235 1/20 0.30
IDH1 O75874 1/20 0.30
IDH2 P48735 1/20 0.30
BCHE P06276 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL19901948 0.84 POLB (0.37) POLBMEN1KMT2A
SCHEMBL19998126 0.82 NAAA (0.35) NAAANFE2L2MEN1KMT2ACTSL
SCHEMBL21657567 0.82 NAAA (0.35) NAAANFE2L2MEN1KMT2ACTSL
SCHEMBL19901949 0.77 RAB9A (0.40) POLBMEN1KMT2A
SCHEMBL17936659 0.75 SLC6A2 (0.42) NAAACARM1PRMT6CTSLCTSB
SCHEMBL19901945 0.74 POLB (0.33) POLBKMT2A
SCHEMBL19680378 0.73 CARM1 (0.48) NAAACARM1PRMT6CTSLCTSB
SCHEMBL19901978 0.72 HTR3E (0.33)
SCHEMBL19901944 0.71 HTR3E (0.38)
SCHEMBL18100897 0.67 ALDH1A1 (0.46) MEN1KMT2A

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-10928727-B2 Actinic ray-sensitive or radiation-sensitive resin composition, actinic ray-sensitive or radiation-sensitive film, mask blank including actinic ray-sensitive or radiation-sensitive film, pattern forming method, and method for manufacturing FUJIFILM CORPORATION (JP) 2021-02-23 US disclosed
US-20180120701-A1 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, MASK BLANK INCLUDING ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE FILM, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE FUJIFILM CORPORATION (JP) 2018-05-03 US disclosed