SCHEMBL4452953

SCHEMBL4452953

CCS(=O)(=O)[O-].c1ccc([I+]c2ccccc2)cc1

nearest known ligand 0.43

Known targets — ChEMBL curated mechanism

FGFR1FGFR2FGFR3FGFR4FLT1FLT4KDRPDGFRAPDGFRB

The experimentally established mechanism targets of None. The predicted profile below is derived independently by chemical similarity — agreement is a validation signal, a miss is honest.

Predicted protein targets (top 20)

geneUniProtsupporting neighboursconfidence
PSIP1 O75475 1/20 0.43
CA12 O43570 4/20 0.42
CA2 P00918 3/20 0.42
CA9 Q16790 3/20 0.42
ATM Q13315 2/20 0.36
SMN1; SMN2 Q16637 1/20 0.36
NPSR1 Q6W5P4 1/20 0.36
CA7 P43166 1/20 0.35
CA14 Q9ULX7 1/20 0.35
ELANE P08246 1/20 0.35
L3MBTL1 Q9Y468 2/20 0.35
CYP1A2 P05177 1/20 0.35
CYP3A4 P08684 1/20 0.35
CES2 O00748 1/20 0.34
CES1 P23141 1/20 0.34
HSD11B1 P28845 1/20 0.34
NR3C2 P08235 1/20 0.34
LMNA P02545 1/20 0.34
HTT P42858 1/20 0.34
TP53 P04637 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL7573539 0.88 CA12 (0.38) PSIP1CA12CA2CA9
SCHEMBL1628635 0.86 KEAP1 (0.39) PSIP1CA12CA2CA9NPSR1
SCHEMBL7582832 0.86 ALDH1A1 (0.49) NPSR1HSD11B1LMNAHTT
Sulfuric Acid SCHEMBL1777697 0.85 HTR6 (0.39) PSIP1CA12CA2CA9SMN1; SMN2
SCHEMBL5447853 0.85 PABPC1 (0.41) PSIP1CA12CA2CA9CES2
SCHEMBL452106 0.82 CES2 (0.39) CES2CES1
SCHEMBL5707382 0.82 ALDH1A1 (0.36) CA12CA2CA9NR3C2LMNA
SCHEMBL11393462 0.81 FAAH (0.39) CA12CA2CA9SMN1; SMN2CA7
Sulfuric Acid SCHEMBL1062108 0.81 TSHR (0.44) CA12CA2CA9SMN1; SMN2CA7
Phenylmethanesulfonic Acid SCHEMBL3424660 0.81 CA2 (0.47) CA12CA2CA9SMN1; SMN2CA7

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 8 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
EP-2469337-A1 Positive photosensitive resin composition, method for forming pattern, and electronic component Hitachi Chemical DuPont MicroSystems Ltd. (JP) 2012-06-27 EP disclosed
US-7638254-B2 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD (JP) 2009-12-29 US disclosed
US-20090011364-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ELECTRONIC PART HATTORI TAKASHI 2009-01-08 US disclosed
US-7435525-B2 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2008-10-14 US disclosed
US-20070122733-A1 Positive photosensitive resin composition, method for forming pattern, and electronic part HITACHI CHEMICAL DUPONT MICROSYSTEMS LTD. (JP) 2007-05-31 US disclosed
EP-1744213-A1 POSITIVE PHOTOSENSITIVE RESIN COMPOSITION, METHOD FOR FORMING PATTERN, AND ELECTRONIC COMPONENT Hitachi Chemical DuPont Microsystems Ltd. (JP) 2007-01-17 EP disclosed
US-20020196896-A1 Exposure method, exposure apparatus, X-ray mask, semiconductor device and microstructure MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2002-12-26 US disclosed
EP-1193553-A2 Exposure method, exposure apparatus, x-ray mask, semiconductor device and microstructure MITSUBISHI DENKI KABUSHIKI KAISHA (JP) 2002-04-03 EP disclosed