SCHEMBL13683065

SCHEMBL13683065

CCC(C)C(=O)OCCOCOc1ccccc1-c1ccccc1

nearest known ligand 0.54

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 12/20 0.54
KMT2A Q03164 4/20 0.54
MEN1 O00255 3/20 0.54
PKM P14618 1/20 0.52
ALDH1A1 P00352 9/20 0.48
SMN1; SMN2 Q16637 3/20 0.46
TDP1 Q9NUW8 2/20 0.46
USP2 O75604 1/20 0.45
LMNA P02545 1/20 0.45
MAPT P10636 1/20 0.45
MAPK1 P28482 1/20 0.45
HTT P42858 1/20 0.45
ADRB2 P07550 2/20 0.44
ADRB1 P08588 1/20 0.44
L3MBTL1 Q9Y468 1/20 0.44

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL14827298 0.90 KDM4E (0.60) KDM4EKMT2AMEN1PKMALDH1A1
SCHEMBL13683054 0.83 MAPT (0.48) PKMSMN1; SMN2MAPT
SCHEMBL13683026 0.83 TDP1 (0.46) KDM4EKMT2AMEN1PKMALDH1A1
SCHEMBL13683044 0.82 L3MBTL1 (0.47) KDM4EKMT2AMEN1PKMALDH1A1
SCHEMBL13683057 0.81 PTGS2 (0.41) KDM4EKMT2AMEN1ALDH1A1SMN1; SMN2
SCHEMBL13683055 0.80 ALDH1A1 (0.53) KDM4EKMT2AMEN1ALDH1A1SMN1; SMN2
SCHEMBL14827289 0.79 KDM4E (0.44) KDM4EKMT2AMEN1PKMALDH1A1
SCHEMBL13683063 0.79 RXRA (0.46)
SCHEMBL825432 0.78 KDM4E (0.51) KDM4EKMT2AMEN1PKMALDH1A1
SCHEMBL12159342 0.78 RARB (0.52) KDM4ESMN1; SMN2MAPT

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7592118-B2 Addition polymer ; insoluble in alkali developer ; acid generator; microlithography, resolution sensitivity, accuracy pattern profile FUJIFILM CORPORATION (JP) 2009-09-22 US disclosed
US-20080241743-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed