SCHEMBL525839

SCHEMBL525839

CC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)F

nearest known ligand 0.36

Predicted protein targets (top 3)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 1/20 0.36
TSHR P16473 1/20 0.36
TDP1 Q9NUW8 1/20 0.36

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL1773644 0.97 KDM4E (0.34) KDM4ETSHRTDP1
SCHEMBL1772081 0.97 KDM4E (0.34) KDM4ETSHRTDP1
SCHEMBL1772592 0.97 KDM4E (0.34) KDM4ETSHRTDP1
SCHEMBL1773122 0.97 KDM4E (0.34) KDM4ETSHRTDP1
SCHEMBL525110 0.90 KDM4E (0.37) KDM4ETSHRTDP1
Iodide SCHEMBL7635296 0.88 KDM4E (0.36) KDM4ETSHRTDP1
SCHEMBL498059 0.83 KDM4E (0.43) KDM4ETSHRTDP1
SCHEMBL10135097 0.81 KDM4E (0.41) KDM4ETSHRTDP1
SCHEMBL5489726 0.79 TSHR (0.42) KDM4ETSHRTDP1
SCHEMBL1824498 0.79 TSHR (0.42) KDM4ETSHRTDP1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 232 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-11782342-B2 Salt and photoresist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-10-10 US disclosed
US-11640114-B2 Compound, resin, photoresist composition and process for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-05-02 US disclosed
CN-113286829-B Colored curable resin composition 住友化学株式会社 2023-03-28 CN disclosed
US-11556056-B2 Salt, acid generator, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-01-17 US disclosed
EP-3556783-B1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL CO (JP) 2022-12-28 EP disclosed
CN-114555653-A Composition, cured product, sealing material for organic electroluminescent display element, and organic electroluminescent display device 电化株式会社 2022-05-27 CN disclosed
CN-114555661-A Composition, cured product, sealing material for organic electroluminescent display element, and organic electroluminescent display device 电化株式会社 2022-05-27 CN disclosed
US-11327399-B2 Photoresist composition and process for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2022-05-10 US disclosed
US-11261273-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2022-03-01 US disclosed
US-11198748-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-12-14 US disclosed
US-20100190104-A1 METHOD FOR PATTERN FORMATION AND RESIN COMPOSITION FOR USE IN THE METHOD JSR CORPORATION (JP) 2010-07-29 US disclosed
US-7704657-B2 Electrophotographic photosensitive member, method of manufacturing electrophotographic photosensitive member, process cartridge, and electrophotographic apparatus CANON KABUSHIKI KAISHA (JP) 2010-04-27 US disclosed
EP-2128706-A1 RESIST PATTERN FORMATION METHOD, AND RESIN COMPOSITION CAPABLE OF INSOLUBILIZING RESIST PATTERN JSR Corporation (JP) 2009-12-02 EP disclosed
US-20090180800-A1 ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, METHOD OF MANUFACTURING ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, PROCESS CARTRIDGE, AND ELECTROPHOTOGRAPHIC APPARATUS CANON KABUSHIKI KAISHA (JP) 2009-07-16 US disclosed
US-7553594-B2 Electrophotographic photosensitive member, method of manufacturing electrophotographic photosensitive member, process cartridge, and electrophotographic apparatus CANON KABUSHIKI KAISHA (JP) 2009-06-30 US disclosed
US-20090130576-A1 ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, METHOD OF MANUFACTURING ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, PROCESS CARTRIDGE, AND ELECTROPHOTOGRAPHIC APPARATUS CANON KABUSHIKI KAISHA (JP) 2009-05-21 US disclosed
US-20080199794-A1 ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, METHOD OF MANUFACTURING ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, PROCESS CARTRIDGE, AND ELECTROPHOTOGRAPHIC APPARATUS CANON KABUSHIKI KAISHA (JP) 2008-08-21 US disclosed
US-20080199795-A1 ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, METHOD OF MANUFACTURING ELECTROPHOTOGRAPHIC PHOTOSENSITIVE MEMBER, PROCESS CARTRIDGE, AND ELECTROPHOTOGRAPHIC APPARATUS CANON KABUSHIKI KAISHA (JP) 2008-08-21 US disclosed
US-7217492-B2 Onium salt compound and radiation-sensitive resin composition JSR CORPORATION (JP) 2007-05-15 US disclosed
US-20050053861-A1 Onium salt compound and radiation-sensitive resin composition JSR CORPORATION (JP) 2005-03-10 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (3 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-11556056-B2 Salt, acid generator, resist composition and method for producing resist pattern CLIC1, OXSR1, RER1 KDM4E 2394/4885TSHR 1093/4885TDP1 4142/4885
US-11782342-B2 Salt and photoresist composition containing the same CRY1, REN, SLC6A19 KDM4E 3783/4885TSHR 1975/4885TDP1 3753/4885
US-11640114-B2 Compound, resin, photoresist composition and process for producing photoresist pattern HAX1, BRIX1, RXRA KDM4E 1727/4885TSHR 1050/4885TDP1 2854/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.