SCHEMBL13683049

SCHEMBL13683049

CCC(C)(C)C(=O)OCCOCOc1cccc(OC(C)=O)c1

nearest known ligand 0.43

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
CYP3A4 P08684 1/20 0.43
KDM4E B2RXH2 3/20 0.41
LMNA P02545 3/20 0.40
L3MBTL1 Q9Y468 4/20 0.38
MAPK1 P28482 3/20 0.38
ACHE P22303 2/20 0.38
MAPT P10636 1/20 0.38
TDP1 Q9NUW8 3/20 0.37
ALDH1A1 P00352 2/20 0.37
TSHR P16473 2/20 0.37
KMT2A Q03164 2/20 0.34
MTNR1A P48039 1/20 0.34
MTNR1B P49286 1/20 0.34
MEN1 O00255 1/20 0.34
NSD2 O96028 1/20 0.34
SMN1; SMN2 Q16637 1/20 0.34

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL13683051 0.89 ELANE (0.40) LMNAL3MBTL1MAPK1MAPTALDH1A1
SCHEMBL13683043 0.86 CHRNB2 (0.43) CYP3A4KDM4EL3MBTL1MAPK1TDP1
SCHEMBL13683039 0.85 L3MBTL1 (0.50) KDM4ELMNAL3MBTL1MAPK1TDP1
SCHEMBL13683041 0.85 TDP1 (0.44) KDM4ETDP1TSHRMTNR1AMTNR1B
SCHEMBL13683056 0.83 HDAC1 (0.46) KDM4E
SCHEMBL13683066 0.81 PPARG (0.47) KDM4EMAPK1MAPTTDP1ALDH1A1
SCHEMBL13683053 0.81 PTGS2 (0.38) KDM4ELMNATDP1ALDH1A1TSHR
SCHEMBL18135084 0.80 CYP3A4 (0.57) CYP3A4LMNAACHEMAPTTDP1
SCHEMBL13683037 0.78 MEN1 (0.47) CYP3A4LMNAL3MBTL1MAPTALDH1A1
SCHEMBL13683046 0.78 CHRM2 (0.41) LMNAMAPK1ALDH1A1TSHRSMN1; SMN2

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 2 patents. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7592118-B2 Addition polymer ; insoluble in alkali developer ; acid generator; microlithography, resolution sensitivity, accuracy pattern profile FUJIFILM CORPORATION (JP) 2009-09-22 US disclosed
US-20080241743-A1 POSITIVE RESIST COMPOSITION AND PATTERN FORMING METHOD USING THE SAME FUJIFILM CORPORATION (JP) 2008-10-02 US disclosed