SCHEMBL19929339

SCHEMBL19929339

CCC1(OC(=O)OC)CC2CCC1C2

nearest known ligand 0.35

Predicted protein targets (top 6)

geneUniProtsupporting neighboursconfidence
ALDH1A1 P00352 5/20 0.35
KMT2A Q03164 2/20 0.31
SMN1; SMN2 Q16637 1/20 0.31
EPHX2 P34913 2/20 0.31
HSD11B1 P28845 1/20 0.31
MEN1 O00255 1/20 0.31

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL25509618 0.84 HSD11B1 (0.35) HSD11B1
SCHEMBL439022 0.84 HSD11B1 (0.32) HSD11B1
SCHEMBL9608685 0.83 HSD11B1 (0.30) HSD11B1
SCHEMBL2611789 0.83 HSD11B1 (0.31) ALDH1A1HSD11B1
SCHEMBL4903389 0.83 HSD11B1 (0.31) ALDH1A1HSD11B1
SCHEMBL14839298 0.83 HSD11B1 (0.31) HSD11B1
SCHEMBL26939202 0.82 HSD11B1 (0.35) HSD11B1
SCHEMBL785874 0.81 ALDH1A1 (0.31) ALDH1A1
SCHEMBL19139315 0.80 HSD11B1 (0.30) ALDH1A1HSD11B1
SCHEMBL12197284 0.80 ALDH1A1 (0.33) ALDH1A1HSD11B1

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 31 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2024-06-27 US disclosed
US-20230314939-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-10-05 US disclosed
US-20230305391-A1 SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-09-28 US disclosed
US-20230305392-A1 SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-09-28 US disclosed
US-11762287-B2 Onium salt compound, chemically amplified resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-09-19 US disclosed
US-11762287-B2 Onium salt compound, chemically amplified resist composition and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2023-09-19 US disclosed
US-20230266666-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-08-24 US disclosed
US-11681224-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-06-20 US disclosed
US-11681224-B2 Resin, resist composition and method for producing resist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-06-20 US disclosed
US-20230161250-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2023-05-25 US disclosed
US-10975028-B2 Salt and photoresist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-04-13 US disclosed
US-10915022-B2 Photoresist composition and process for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2021-02-09 US disclosed
US-10838300-B2 Salt and photoresist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-11-17 US disclosed
US-20200326625-A1 COMPOUND, RESIN, PHOTORESIST COMPOSITION AND PROCESS FOR PRODUCING PHOTORESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-10-15 US disclosed
US-10747111-B2 Compound, resin, photoresist composition and process for producing photoresist pattern SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-08-18 US disclosed
US-20200064735-A1 RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2020-02-27 US disclosed
US-20190112265-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2019-04-18 US disclosed
US-20180065924-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-03-08 US disclosed
US-20180065924-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-03-08 US disclosed
US-20180065925-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2018-03-08 US disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (13 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20200326625-A1 COMPOUND, RESIN, PHOTORESIST COMPOSITION AND PROCESS FOR PRODUCING PHOTORESIST PATTERN HAX1, BRIX1, RXRA ALDH1A1 2800/4885KMT2A 1657/4885SMN1; SMN2 2745/4885
US-20230161250-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN RIMKLA, GAR1, PCCA ALDH1A1 93/4885KMT2A 2126/4885SMN1; SMN2 3574/4885
US-20240210824-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN SCO2, CBR1, OXGR1 ALDH1A1 492/4885KMT2A 2023/4885SMN1; SMN2 4386/4885
US-11762287-B2 Onium salt compound, chemically amplified resist composition and patterning process IDUA, SLC6A5, SLC6A9 ALDH1A1 4322/4885KMT2A 2745/4885SMN1; SMN2 3745/4885
US-20230305391-A1 SALT, ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN RER1, H1-0, BET1 ALDH1A1 1692/4885KMT2A 521/4885SMN1; SMN2 2354/4885
US-20190112265-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME HAX1, PRXL2A, CRY1 ALDH1A1 3728/4885KMT2A 1142/4885SMN1; SMN2 2576/4885
US-20230314939-A1 CARBOXYLATE, CARBOXYLIC ACID GENERATOR, RESIN, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-10, H1-0, HCAR1 ALDH1A1 124/4885KMT2A 1333/4885SMN1; SMN2 4430/4885
US-10747111-B2 Compound, resin, photoresist composition and process for producing photoresist pattern HAX1, BRIX1, RXRA ALDH1A1 2800/4885KMT2A 1657/4885SMN1; SMN2 2745/4885
US-10975028-B2 Salt and photoresist composition containing the same HAX1, PRXL2A, CRY1 ALDH1A1 3728/4885KMT2A 1142/4885SMN1; SMN2 2576/4885
US-10838300-B2 Salt and photoresist composition containing the same C1S, C1R, CRY1 ALDH1A1 1698/4885KMT2A 1015/4885SMN1; SMN2 3246/4885
US-20180065925-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME C1S, C1R, CRY1 ALDH1A1 1698/4885KMT2A 1015/4885SMN1; SMN2 3246/4885
US-20230266666-A1 SALT, ACID GENERATOR, RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN H1-0, H1-4, CHRM1 ALDH1A1 1862/4885KMT2A 1203/4885SMN1; SMN2 3927/4885
US-20180065924-A1 SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME C1R, RER1, C1S ALDH1A1 2788/4885KMT2A 654/4885SMN1; SMN2 3631/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.