Tetraphenylphosphonium

Tetraphenylphosphonium

SCHEMBL7931793

O=C([O-])C(F)(F)F.c1ccc([P+](c2ccccc2)(c2ccccc2)c2ccccc2)cc1

nearest known ligand 0.45

Full drug profile on Sugi Atlas →

Predicted protein targets (top 15)

geneUniProtsupporting neighboursconfidence
CES1 P23141 7/20 0.45
CPA1 P15085 1/20 0.41
CA2 P00918 1/20 0.38
CA4 P22748 1/20 0.38
CYP1A2 P05177 2/20 0.36
CYP2D6 P10635 2/20 0.36
ALDH1A1 P00352 1/20 0.36
TSHR P16473 1/20 0.36
CYP2C19 P33261 1/20 0.36
PTPN1 P18031 1/20 0.34
FAAH O00519 3/20 0.34
HDAC6 Q9UBN7 1/20 0.34
TDP1 Q9NUW8 1/20 0.34
CES2 O00748 1/20 0.33
SRC P12931 1/20 0.33

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
Tetraphenylphosphonium SCHEMBL4388860 0.84 CA2 (0.46) CES1CA2CA4CYP1A2CYP2D6
Tetraphenylphosphonium SCHEMBL21957826 0.83 CYP1A2 (0.40) CES1CA2CA4CYP1A2CYP2D6
Tetraphenylphosphonium SCHEMBL1155888 0.81 CA2 (0.44) CES1CA2CA4CYP1A2CYP2D6
SCHEMBL18695610 0.81 CES1 (0.39) CES1CPA1CA2CA4CYP1A2
Tetraphenylphosphonium SCHEMBL1037056 0.79 CA2 (0.42) CES1CA2CA4CYP1A2CYP2D6
Tetraphenylphosphonium SCHEMBL21957839 0.79 CA4 (0.55) CES1CPA1CA2CA4CYP1A2
Trifluoroacetic Acid SCHEMBL10954936 0.79 CYP2D6 (0.43) CES1CPA1CYP1A2CYP2D6ALDH1A1
Trifluoroacetic Acid SCHEMBL10946380 0.77 CES1 (0.48) CES1CPA1CA2CA4PTPN1
Tetraphenylphosphonium SCHEMBL7944626 0.77 CA2 (0.41) CES1CA2CA4CYP1A2CYP2D6
Tetraphenylphosphonium SCHEMBL21957776 0.77 ALDH1A1 (0.52) CES1CA2CA4CYP1A2CYP2D6

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 77 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-20260118767-A1 REVERSE PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-04-30 US disclosed
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2026-02-12 US disclosed
EP-4692941-A2 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS Shin-Etsu Chemical Co., Ltd. (JP) 2026-02-11 EP disclosed
EP-4621486-A2 POLYVALENT AMMONIUM SALT COMPOUND, COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-09-24 EP disclosed
US-20250289931-A1 POLYVALENT AMMONIUM SALT COMPOUND, COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-09-18 US disclosed
EP-4592299-A1 SILICON-CONTAINING SULFONIUM SALT COMPOUND, COMPOSITION FOR FORMING A SILICON-CONTAINING RESIST UNDERLAYER FILM, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-07-30 EP disclosed
US-20250237953-A1 SILICON-CONTAINING SULFONIUM SALT COMPOUND, COMPOSITION FOR FORMING A SILICON-CONTAINING RESIST UNDERLAYER FILM, AND PATTERNING PROCESS SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-07-24 US disclosed
US-12332567-B2 Composition for forming silicon-containing resist underlayer film, patterning process, and silicon compound SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-06-17 US disclosed
US-12332565-B2 Thermosetting iodine- and silicon-containing material, composition containing the material for forming resist underlayer film for EUV lithography, and patterning process SHIN-ETSU CHEMICAL CO., LTD. (JP) 2025-06-17 US disclosed
EP-4539986-A2 CATALYTIC SYSTEM CONTAINING IONIC LIQUIDS AND A PROCESS FOR PRODUCING HYDROGEN FROM PLASTIC MATERIALS USING SAID CATALYTIC SYSTEM Fundación Centro de Investigación Cooperativa de Energías Alternativas, CIC Energigune Fundazioa (ES) 2025-04-23 EP disclosed
EP-0834495-B1 Process for preparing diaryl carbonate UBE INDUSTRIES (JP) 2000-12-27 EP disclosed
US-5892091-A PHOSPHOROUS CATALYSTS AND HALOGEN ATOMS UBE INDUSTRIES, LTD. (JP) 1999-04-06 US disclosed
US-5892089-A FROM DIARYL OXALATE IN LIQUID PHASE BY DECARBONYLATION USING ORGANIC PHOSHORUS COMPOUND CATALYST UBE INDUSTRIES, LTD. (JP) 1999-04-06 US disclosed
EP-0737665-B1 Process for preparation of diaryl carbonate UBE INDUSTRIES (JP) 1998-10-21 EP disclosed
US-5792883-A Preparation of diaryl carbonate UBE INDUSTRIES, LTD. (JP) 1998-08-11 US disclosed
EP-0834496-A1 Preparation of diaryl carbonate UBE INDUSTRIES, LTD. (JP) 1998-04-08 EP disclosed
EP-0834495-A1 Process for preparing diaryl carbonate UBE INDUSTRIES, LTD. (JP) 1998-04-08 EP disclosed
EP-0826658-A1 Catalyst for decarbonylation reaction UBE INDUSTRIES, LTD. (JP) 1998-03-04 EP disclosed
US-5648510-A DECARBONYLATION OF OXALATE UBE INDUSTRIES, LTD. (JP) 1997-07-15 US disclosed
EP-0737665-A1 Process for preparation of diaryl carbonate UBE INDUSTRIES, LTD. (JP) 1996-10-16 EP disclosed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (6 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-12332567-B2 Composition for forming silicon-containing resist underlayer film, patterning process, and silicon compound SMC1A, CDH1, SMC4 CES1 1861/4885CPA1 1713/4885CA2 3442/4885
US-20250289931-A1 POLYVALENT AMMONIUM SALT COMPOUND, COMPOSITION FOR FORMING SILICON-CONTAINING RESIST UNDERLAYER FILM, AND PATTERNING PROCESS ASH2L, PUF60, IDUA CES1 4246/4885CPA1 3454/4885CA2 1064/4885
US-12332565-B2 Thermosetting iodine- and silicon-containing material, composition containing the material for forming resist underlayer film for EUV lithography, and patterning process RPS4X, SIK3, MLX CES1 3631/4885CPA1 3961/4885CA2 2255/4885
US-20260118767-A1 REVERSE PATTERNING PROCESS EFNA1, EPHA4, ETV6 CES1 2618/4885CPA1 1467/4885CA2 2902/4885
US-20260044081-A1 COMPOSITION FOR FORMING SILICON-CONTAINING RESIST FILM AND PATTERNING PROCESS SMC1A, SPOUT1, LBR CES1 3024/4885CPA1 4289/4885CA2 2105/4885
US-20250237953-A1 SILICON-CONTAINING SULFONIUM SALT COMPOUND, COMPOSITION FOR FORMING A SILICON-CONTAINING RESIST UNDERLAYER FILM, AND PATTERNING PROCESS SMURF1, OSR1, SIK1 CES1 3505/4885CPA1 3186/4885CA2 972/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.