SCHEMBL721606

SCHEMBL721606

C=CCC1(OC(=O)C2CC3C=CC2C3)C2CC3CC(C2)CC1C3

nearest known ligand 0.36

Predicted protein targets (top 16)

geneUniProtsupporting neighboursconfidence
KDM4E B2RXH2 1/20 0.36
LMNA P02545 1/20 0.36
POLB P06746 2/20 0.35
APEX1 P27695 1/20 0.35
RECQL P46063 1/20 0.35
BLM P54132 1/20 0.35
ESR2 Q92731 1/20 0.35
HSD17B10 Q99714 1/20 0.35
TDP1 Q9NUW8 1/20 0.35
L3MBTL1 Q9Y468 1/20 0.35
ALDH1A1 P00352 5/20 0.34
KMT2A Q03164 2/20 0.34
RAB9A P51151 1/20 0.34
HPGD P15428 1/20 0.33
EPHX2 P34913 2/20 0.31
ESR1 P03372 1/20 0.30

Click a target to see other patent compounds predicted against it — the reverse direction, in place.

Similar compounds — the chemically nearest patent molecules

Nearest neighbours by Morgan-fingerprint cosine across the patent-compound collection, with each neighbour's top predicted target and the predicted targets it shares with this molecule.

Compoundsimilaritytop predictedshared targets
SCHEMBL525636 0.84 KDM4E (0.40) KDM4ELMNAPOLBAPEX1RECQL
SCHEMBL23187878 0.79 KDM4E (0.41) KDM4ELMNAPOLBAPEX1RECQL
SCHEMBL524854 0.79 KDM4E (0.41) KDM4ELMNAPOLBAPEX1RECQL
SCHEMBL12251470 0.75 KDM4E (0.34) KDM4ELMNAPOLBAPEX1RECQL
SCHEMBL14877443 0.73 HSD11B1 (0.31) ALDH1A1KMT2A
SCHEMBL30209890 0.73 ALDH1A1 (0.44) KDM4ELMNAPOLBAPEX1RECQL
SCHEMBL5025391 0.73 ALDH1A1 (0.41) KDM4ELMNAPOLBAPEX1RECQL
SCHEMBL1077901 0.72 HSD11B1 (0.30)
SCHEMBL14560632 0.72 ALDH1A1 (0.45) KDM4ELMNAPOLBAPEX1RECQL
SCHEMBL1350530 0.71

Similarity is cosine over the 2,048-bit Morgan fingerprint (≈ Tanimoto). Identical fingerprints score 1.00.

Patent provenance — the patents this molecule appears in, and who filed them

Claimed or disclosed in 153 patents — showing the first 20. claimed = in the patent's claims; disclosed = body only.

PatentTitleAssigneePublishedPriorityFilingCountryStatus
US-7862980-B2 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2011-01-04 US claimed
US-7803513-B2 Lithography; semiconductor microfabrication SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-09-28 US claimed
US-7741007-B2 Lithography; semiconductor microfabrication SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2010-06-22 US claimed
US-7611822-B2 Positive resist composition used for semiconductor microfabrication employing a lithography process contains an acid generator comprising a compound generating an acid by irradiation and a monomer having a bulky and acid-labile group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-11-03 US claimed
US-7579132-B2 Salt suitable for an acid generator and a chemically amplified positive resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-08-25 US claimed
US-7531686-B2 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-05-12 US claimed
US-7527910-B2 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-05-05 US claimed
EP-1873143-B1 A salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL CO (JP) 2009-04-15 EP claimed
US-20090042128-A1 Positive resist composition used for semiconductor microfabrication employing a lithography process contains an acid generator comprising a compound generating an acid by irradiation and a monomer having a bulky and acid-labile group SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2009-02-12 US claimed
US-20080248423-A1 Lithography; semiconductor microfabrication SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2008-10-09 US claimed
US-7301047-B2 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-11-27 US claimed
US-7262321-B2 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-08-28 US claimed
US-20070184382-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-08-09 US claimed
US-20070122750-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-05-31 US claimed
US-20070100158-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-05-03 US claimed
US-20070100096-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED 2007-05-03 US claimed
US-20070078269-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2007-04-05 US claimed
US-20060194982-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SUMITOMO CHEMICAL COMPANY, LIMITED (JP) 2006-08-31 US claimed
EP-1125917-A1 Alkyladamantyl esters and their preparation Chem Search Corporation (KR) 2001-08-22 EP claimed
US-6222061-B1 FOR PREPARING FLAME RETARDANTS CHEM SEARCH CORP. (KR) 2001-04-24 US claimed

Patent text — is the patent's own abstract consistent with the prediction?

For each of this compound's patents that has machine-readable text (6 of them — usually the abstract, not the full specification), we ask MedCPT which protein the text reads most about, and where the chemistry-predicted target lands among 4885 human targets. A high rank means the patent's own wording is consistent with the prediction — a weak, independent signal, not proof of activity.

PatentTitleText reads most aboutPredicted target · text-rank
US-20090042128-A1 Positive resist composition used for semiconductor microfabrication employing a lithography process contains an acid generator comprising a compound generating an acid by irradiation and a monomer having a bulky and acid-labile group FRG1, ACSL3, HCN3 KDM4E 2840/4885LMNA 285/4885POLB 264/4885
US-20060194982-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same ASIC1, SLC9A1, NHERF1 KDM4E 3449/4885LMNA 2076/4885POLB 161/4885
US-20070100096-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same KCNH3, KCNN4, NHERF1 KDM4E 2059/4885LMNA 1964/4885POLB 250/4885
US-20070122750-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same HCN3, NHERF1, HCN4 KDM4E 2927/4885LMNA 2272/4885POLB 279/4885
US-20070078269-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same HCN4, HCN3, HCN1 KDM4E 2848/4885LMNA 2741/4885POLB 146/4885
US-20070100158-A1 Salt suitable for an acid generator and a chemically amplified resist composition containing the same SLC26A3, RFC1, RFC2 KDM4E 3848/4885LMNA 1557/4885POLB 132/4885

“Text reads most about” is the patent abstract's nearest protein in MedCPT space (background-debiased). Only ~1.4% of patents have machine-readable text, so most compounds won't have this panel.